Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals
5 pags.; 5 figs.; 1 tab.
| Autores: | , , , , , , , , , , , , |
|---|---|
| Formato: | artículo |
| Fecha de publicación: | 2014 |
| País: | España |
| Recursos: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/111691 |
| Acesso em linha: | http://hdl.handle.net/10261/111691 |
| Access Level: | acceso abierto |
| Palavra-chave: | Ellipsometry Dielectric function Copper X-ray diffraction Thin film growth |
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oai:digital.csic.es:10261/111691 |
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Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystalsLeón, M.Levcenko, S.Serna, RosalíaBodnar, I. V.Nateprov, A.Guc, M.Gurieva, G.López, N.Merino, J. M.Caballero, RaquelSchorr, S.Pérez-Rodríguez, A.Arushanov, E.EllipsometryDielectric functionCopperX-ray diffractionThin film growth5 pags.; 5 figs.; 1 tab.Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu 2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8–4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8–4.5 eV photon energy range.This work was supported by projects: Marie Curie-IRSES (PVICOKEST, GA: 269167), FRCFB 13.820.05.11/BF, 14.819.02.17F, TEC2012-38901-C02-01 (Spain) and the institutional Project No. 11.817.05.03A. R.C. acknowledges financial support from Spanish MINECO within the program Ramón y Cajal (RYC-2011-08521).Peer ReviewedAmerican Institute of PhysicsConsejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]2015201520142015info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501http://hdl.handle.net/10261/111691reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Ingléshttp://dx.doi.org/10.1063/1.4892548Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/1116912026-05-22T06:33:51Z |
| dc.title.none.fl_str_mv |
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals |
| title |
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals |
| spellingShingle |
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals León, M. Ellipsometry Dielectric function Copper X-ray diffraction Thin film growth |
| title_short |
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals |
| title_full |
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals |
| title_fullStr |
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals |
| title_full_unstemmed |
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals |
| title_sort |
Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals |
| dc.creator.none.fl_str_mv |
León, M. Levcenko, S. Serna, Rosalía Bodnar, I. V. Nateprov, A. Guc, M. Gurieva, G. López, N. Merino, J. M. Caballero, Raquel Schorr, S. Pérez-Rodríguez, A. Arushanov, E. |
| author |
León, M. |
| author_facet |
León, M. Levcenko, S. Serna, Rosalía Bodnar, I. V. Nateprov, A. Guc, M. Gurieva, G. López, N. Merino, J. M. Caballero, Raquel Schorr, S. Pérez-Rodríguez, A. Arushanov, E. |
| author_role |
author |
| author2 |
Levcenko, S. Serna, Rosalía Bodnar, I. V. Nateprov, A. Guc, M. Gurieva, G. López, N. Merino, J. M. Caballero, Raquel Schorr, S. Pérez-Rodríguez, A. Arushanov, E. |
| author2_role |
author author author author author author author author author author author author |
| dc.contributor.none.fl_str_mv |
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72] |
| dc.subject.none.fl_str_mv |
Ellipsometry Dielectric function Copper X-ray diffraction Thin film growth |
| topic |
Ellipsometry Dielectric function Copper X-ray diffraction Thin film growth |
| description |
5 pags.; 5 figs.; 1 tab. |
| publishDate |
2014 |
| dc.date.none.fl_str_mv |
2014 2015 2015 2015 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article http://purl.org/coar/resource_type/c_6501 |
| format |
article |
| dc.identifier.none.fl_str_mv |
http://hdl.handle.net/10261/111691 |
| url |
http://hdl.handle.net/10261/111691 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.relation.none.fl_str_mv |
http://dx.doi.org/10.1063/1.4892548 Sí |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
| dc.publisher.none.fl_str_mv |
American Institute of Physics |
| publisher.none.fl_str_mv |
American Institute of Physics |
| dc.source.none.fl_str_mv |
reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC instname:Consejo Superior de Investigaciones Científicas (CSIC) |
| instname_str |
Consejo Superior de Investigaciones Científicas (CSIC) |
| reponame_str |
DIGITAL.CSIC. Repositorio Institucional del CSIC |
| collection |
DIGITAL.CSIC. Repositorio Institucional del CSIC |
| repository.name.fl_str_mv |
|
| repository.mail.fl_str_mv |
|
| _version_ |
1869406897720786944 |
| score |
15,812429 |