Spectroscopic ellipsometry study of Cu2ZnSnS4 bulk poly-crystals

The linear optical properties of Cu2ZnSnS4 bulk poly-crystals have been investigated using spectroscopic ellipsometry in the range of 1.2-4.6 eV at room temperature. The characteristic features identified in the optical spectra are explained by using the Adachi analytical model for the interband tra...

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Detalles Bibliográficos
Autores: Levcenko, Sergiu, Hajdeu Chicarosh, Elena, Garcia Llamas, Elena, Caballero, Raquel, Serna, Rosalía, Bodnar, Ivan V., Victorov, Ivan A., Guc, Maxim, Merino, José Manuel, Pérez Rodríguez, Alejandro, Arushanov, Ernest, León, Máximo
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2018
País:España
Institución:Universidad de Barcelona
Repositorio:Dipòsit Digital de la UB
OAI Identifier:oai:diposit.ub.edu:2445/134698
Acceso en línea:https://hdl.handle.net/2445/134698
Access Level:acceso abierto
Palabra clave:El·lipsometria
Dispositius optoelectrònics
Propietats òptiques
Ellipsometry
Optoelectronic devices
Optical properties
Descripción
Sumario:The linear optical properties of Cu2ZnSnS4 bulk poly-crystals have been investigated using spectroscopic ellipsometry in the range of 1.2-4.6 eV at room temperature. The characteristic features identified in the optical spectra are explained by using the Adachi analytical model for the interband transitions at the corresponding critical points in the Brillouin zone. The experimental data have been modeled over the entire spectral range taking into account the lowest E0 transition near the fundamental absorption edge and E1A and E1B higher energy interband transitions. In addition, the spectral dependences of the refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity values have been accurately determined and are provided since they are essential data for the design of Cu2ZnSnS4 based optoelectronic devices.