Exploitation of OTFTs variability for PUFs implementation and impact of aging

Commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their variability and reliability. The feasibility of implementing Physical Unclonable Functions (PUFs) based on these devices has been evaluated, taking advantage of the high variation in the electrical characterist...

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Detalles Bibliográficos
Autores: Claramunt, Sergi|||0000-0002-2888-7825, Palau, Gerard, Arnal Rus, August|||0000-0002-3425-1057, Crespo Yepes, Albert|||0000-0003-4618-651X, Porti i Pujal, Marc|||0000-0001-7438-3823, Ogier, Simon|||0000-0002-6643-5256, Ramon, Eloi|||0000-0001-9974-8112, Nafria, Montserrat|||0000-0002-9549-2890
Tipo de recurso: artículo
Fecha de publicación:2023
País:España
Institución:Universitat Autònoma de Barcelona
Repositorio:Dipòsit Digital de Documents de la UAB
Idioma:inglés
OAI Identifier:oai:ddd.uab.cat:283390
Acceso en línea:https://ddd.uab.cat/record/283390
https://dx.doi.org/urn:doi:10.1016/j.sse.2023.108698
Access Level:acceso abierto
Palabra clave:Aging
OTFT
PUF
Reliability
Variability
Descripción
Sumario:Commercial Organic Thin Film Transistors (OTFT) have been characterized to evaluate their variability and reliability. The feasibility of implementing Physical Unclonable Functions (PUFs) based on these devices has been evaluated, taking advantage of the high variation in the electrical characteristics among different OTFTs. The eventual impact of device aging on PUFs reliability has been preliminary explored.

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