On the aging of OTFTs and its impact on PUFs reliability
Given the current maturity of printed technologies, Organic Thin-Film Transistors (OTFT) still show high initial variability, which can be beneficial for its exploitation in security applications. In this work, the process-related variability and aging of commercial OTFTs have been characterized to...
| Autores: | , , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2024 |
| País: | España |
| Institución: | Universitat Autònoma de Barcelona |
| Repositorio: | Dipòsit Digital de Documents de la UAB |
| Idioma: | inglés |
| OAI Identifier: | oai:ddd.uab.cat:291256 |
| Acceso en línea: | https://ddd.uab.cat/record/291256 https://dx.doi.org/urn:doi:10.3390/mi15040443 |
| Access Level: | acceso abierto |
| Palabra clave: | OTFT Variability Reliability PUF Aging BTI HCI |
| Sumario: | Given the current maturity of printed technologies, Organic Thin-Film Transistors (OTFT) still show high initial variability, which can be beneficial for its exploitation in security applications. In this work, the process-related variability and aging of commercial OTFTs have been characterized to evaluate the feasibility of OTFTs-based Physical Unclonable Functions (PUFs) implementation. For our devices, ID-based PUFs show good uniformity and uniqueness. However, PUFs' reliability could be compromised because of the observed transient and aging effects in the OTFTs, which could hinder the reproducibility of the generated fingerprints. A systematic study of the aging of OTFTs has been performed to evaluate the PUFs' reliability. Our results suggest that the observed transient and aging effects could be mitigated so that the OTFTs-based PUFs' reliability could be improved. |
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