High sensitivity temperature measurements to track and Ccompensate aging effects on CMOS amplifiers
This article presents a method to monitor and compensate gain degradation produced by aging in linear CMOS amplifiers. The proposed procedure relies on a stand-alone temperature sensor circuit. DC measurements at the output of the temperature sensor allow to monitor high-frequency gain, and to selec...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2024 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/417222 |
| Acceso en línea: | https://hdl.handle.net/2117/417222 https://dx.doi.org/10.1109/TDMR.2024.3465236 |
| Access Level: | acceso abierto |
| Palabra clave: | Temperature sensors Temperature measurement Gain Monitoring Degradation Transistors Power amplifiers CMOS integrated circuits Aging Aging monitoring Aging compensation Temperature measurements Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats |
| Sumario: | This article presents a method to monitor and compensate gain degradation produced by aging in linear CMOS amplifiers. The proposed procedure relies on a stand-alone temperature sensor circuit. DC measurements at the output of the temperature sensor allow to monitor high-frequency gain, and to select an adaptive biasing to keep a constant gain along the circuit lifetime. The approach is validated experimentally on a high-frequency Power Amplifier, which was subjected to an accelerated aging degradation. Experimental results demonstrate the capability to keep the amplifier gain within 0.3 dB from its fresh value, even after important device aging degradation. |
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