DC temperature measurements to characterize the central frequency and 3 dB bandwidth in mmW power amplifiers
This letter shows how a temperature sensor and a simple DC voltage multimeter can be used as instruments to determine the central frequency and 3 dB bandwidth of a 60 GHz linear power amplifier (PA). Compared to previous works, the DC temperature monitoring now proposed requires a much simpler and c...
| Autores: | , , , , , , |
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| Formato: | artículo |
| Fecha de publicación: | 2015 |
| País: | España |
| Recursos: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/79249 |
| Acesso em linha: | https://hdl.handle.net/2117/79249 https://dx.doi.org/10.1109/LMWC.2015.2479848 |
| Access Level: | acceso abierto |
| Palavra-chave: | Integrated circuits Temperature measurements Built-in test CMOS millimeter wave integrated circuits Design for testability Temperature measurement Circuits integrats Termometria Àrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats Àrees temàtiques de la UPC::Enginyeria electrònica::Instrumentació i mesura |
| Resumo: | This letter shows how a temperature sensor and a simple DC voltage multimeter can be used as instruments to determine the central frequency and 3 dB bandwidth of a 60 GHz linear power amplifier (PA). Compared to previous works, the DC temperature monitoring now proposed requires a much simpler and convenient measurement set-up. In this example, the temperature sensor is embedded in the same silicon die as the PA. Being placed in empty layout spaces next to it, it is proposed as a built-in test circuit. |
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