Monitoring of argon content in materials
It is reported the possibility of monitoring the presence of argon in the surface layer of materials using the fluorescent emission of characteristic K X-rays of argon by irradiation of the surface of the materials with low energy X-rays. The low energy of these characteristic X-rays, 2,97 keV, make...
| Authors: | , |
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| Format: | article |
| Status: | Published version |
| Publication Date: | 2013 |
| Country: | Perú |
| Institution: | Universidad Nacional Mayor de San Marcos |
| Repository: | Revistas - Universidad Nacional Mayor de San Marcos |
| Language: | Spanish |
| OAI Identifier: | oai:revistasinvestigacion.unmsm.edu.pe:article/8657 |
| Online Access: | https://revistasinvestigacion.unmsm.edu.pe/index.php/fisica/article/view/8657 |
| Access Level: | Open access |
| Keyword: | Monitoring argon X-ray fluorescence materials surface. Monitoreo argón fluorescencia de rayos X materiales superficie. |
| Summary: | It is reported the possibility of monitoring the presence of argon in the surface layer of materials using the fluorescent emission of characteristic K X-rays of argon by irradiation of the surface of the materials with low energy X-rays. The low energy of these characteristic X-rays, 2,97 keV, makes possible to monitor the presence of argon down a depth of some five microns. |
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