Synthesis by aerosol assisted chemical vapor deposition and microstructural characterization of PbTiO3 thin films

Thin films of PbTiO3 were deposited onto (001) silicon single-crystal substrates by aerosol assisted chemical vapor deposition method at different temperatures, using organometallic precursors. With the objective of stabilizing and homogenizing the perovskite phase, the films were annealed at 800 °C...

Descripción completa

Detalles Bibliográficos
Autores: JUAN RAMOS CANO, ABEL HURTADO MACIAS, WILBER ANTUNEZ FLORES, LUIS EDMUNDO FUENTES COBAS, PATRICIA AMEZAGA MADRID, MARIO MIKI YOSHIDA
Tipo de recurso: artículo
Estado:Versión enviada para evaluación y publicación
Fecha de publicación:2013
País:México
Institución:Centro de Investigación en Materiales Avanzados
Repositorio:Fuente de Objetos Científicos Open Access del CIMAV
Idioma:inglés
OAI Identifier:oai:cimav.repositorioinstitucional.mx:1004/1844
Acceso en línea:http://cimav.repositorioinstitucional.mx/jspui/handle/1004/1844
Access Level:acceso abierto
Palabra clave:info:eu-repo/classification/Aerosol-assisted chemical vapor deposition/Ferroelectrics
info:eu-repo/classification/Thin films/Lead titanate
info:eu-repo/classification/Scanning electron microscopy/X-ray diffraction
info:eu-repo/classification/cti/1
info:eu-repo/classification/cti/22
info:eu-repo/classification/cti/2299
info:eu-repo/classification/cti/229999
Descripción
Sumario:Thin films of PbTiO3 were deposited onto (001) silicon single-crystal substrates by aerosol assisted chemical vapor deposition method at different temperatures, using organometallic precursors. With the objective of stabilizing and homogenizing the perovskite phase, the films were annealed at 800 °C, in a Pb-rich atmosphere, for 4 and 6 h. The evolution of compositions and microstructure of the films was characterized before and after annealing, by grazing incidence X-ray diffraction, two-dimensional detection of grazing incidence diffraction with synchrotron radiation, scanning electronmicroscopy and high resolution transmission electron microscopy. X-ray diffraction results showed that the crystalline structure of optimized PbTiO3 films corresponded to a tetragonal perovskite-type, with lattice parameters a=0.387(4)nmand c=0.406(4)nm. In addition, the inverse pole figure of the fiber texture representation, had a Gaussian (1, 1, 0) component and distribution width Ω=15°.