Offset and gain calibration circuit for MIM-ISFET devices

A programmable calibration circuit for sensors is proposed in this paper. It carries out gain and offset compensation by adding or subtracting appropriate correction factors to the transfer function of each sensor. Digital programmability makes it possible to automate calibration, paving the way for...

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Detalhes bibliográficos
Autores: Luis Antonio Carrillo-Martínez, MARIA TERESA SANZ PASCUAL, Joel Molina Reyes
Tipo de documento: artigo
Estado:Versión aceptada para publicación
Data de publicação:2013
País:México
Recursos:Instituto Nacional de Astrofísica, Óptica y Electrónica
Repositório:Repositorio Institucional del INAOE
Idioma:inglês
OAI Identifier:oai:inaoe.repositorioinstitucional.mx:1009/2319
Acesso em linha:http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/2319
Access Level:Acceso aberto
Palavra-chave:info:eu-repo/classification/Inspec/Sensor calibration
info:eu-repo/classification/Inspec/ISFET
info:eu-repo/classification/Inspec/Signal conditioning
info:eu-repo/classification/cti/1
info:eu-repo/classification/cti/22
info:eu-repo/classification/cti/2203
id MX_df1aaf17e27baebb2ed25d307865eb55
oai_identifier_str oai:inaoe.repositorioinstitucional.mx:1009/2319
network_acronym_str MX
network_name_str México
repository_id_str
spelling Offset and gain calibration circuit for MIM-ISFET devicesLuis Antonio Carrillo-MartínezMARIA TERESA SANZ PASCUALJoel Molina Reyesinfo:eu-repo/classification/Inspec/Sensor calibrationinfo:eu-repo/classification/Inspec/ISFETinfo:eu-repo/classification/Inspec/Signal conditioninginfo:eu-repo/classification/cti/1info:eu-repo/classification/cti/22info:eu-repo/classification/cti/2203info:eu-repo/classification/cti/2203A programmable calibration circuit for sensors is proposed in this paper. It carries out gain and offset compensation by adding or subtracting appropriate correction factors to the transfer function of each sensor. Digital programmability makes it possible to automate calibration, paving the way for batch calibration. The circuit was designed for a specific sensor structure, a MIMISFET, which was modeled in HSpice. The proposed scheme reduces the offset and gain error due to process variations of both the sensor and the readout circuit. Offset error is reduced from 123 to 20 mV and gain error is reduced from 10.6 to 6.4 mV/pH. Relative error is reduced in the whole sensing range from 13 to 4 %. The circuit was designed in a 0.18 μm standard CMOS process, occupies an area of 115 x 100 μm² and consumes 2.3 mW.Analog Integrated Circuits and Signal Processing2013-05-08info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersionapplication/pdfhttp://inaoe.repositorioinstitucional.mx/jspui/handle/1009/2319reponame:Repositorio Institucional del INAOEinstname:Instituto Nacional de Astrofísica, Óptica y Electrónicainstacron:INAOEengcitation:Guerrero, E., et al., (2013), Offset and gain calibration circuit for MIM-ISFET devices, Analog Integrated Circuits and Signal Processing, Vol. 76(3): 321–333info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-nd/4.0oai:inaoe.repositorioinstitucional.mx:1009/23192024-08-28T03:23:07Z
dc.title.none.fl_str_mv Offset and gain calibration circuit for MIM-ISFET devices
title Offset and gain calibration circuit for MIM-ISFET devices
spellingShingle Offset and gain calibration circuit for MIM-ISFET devices
Luis Antonio Carrillo-Martínez
info:eu-repo/classification/Inspec/Sensor calibration
info:eu-repo/classification/Inspec/ISFET
info:eu-repo/classification/Inspec/Signal conditioning
info:eu-repo/classification/cti/1
info:eu-repo/classification/cti/22
info:eu-repo/classification/cti/2203
info:eu-repo/classification/cti/2203
title_short Offset and gain calibration circuit for MIM-ISFET devices
title_full Offset and gain calibration circuit for MIM-ISFET devices
title_fullStr Offset and gain calibration circuit for MIM-ISFET devices
title_full_unstemmed Offset and gain calibration circuit for MIM-ISFET devices
title_sort Offset and gain calibration circuit for MIM-ISFET devices
dc.creator.none.fl_str_mv Luis Antonio Carrillo-Martínez
MARIA TERESA SANZ PASCUAL
Joel Molina Reyes
author Luis Antonio Carrillo-Martínez
author_facet Luis Antonio Carrillo-Martínez
MARIA TERESA SANZ PASCUAL
Joel Molina Reyes
author_role author
author2 MARIA TERESA SANZ PASCUAL
Joel Molina Reyes
author2_role author
author
dc.subject.none.fl_str_mv info:eu-repo/classification/Inspec/Sensor calibration
info:eu-repo/classification/Inspec/ISFET
info:eu-repo/classification/Inspec/Signal conditioning
info:eu-repo/classification/cti/1
info:eu-repo/classification/cti/22
info:eu-repo/classification/cti/2203
info:eu-repo/classification/cti/2203
topic info:eu-repo/classification/Inspec/Sensor calibration
info:eu-repo/classification/Inspec/ISFET
info:eu-repo/classification/Inspec/Signal conditioning
info:eu-repo/classification/cti/1
info:eu-repo/classification/cti/22
info:eu-repo/classification/cti/2203
info:eu-repo/classification/cti/2203
description A programmable calibration circuit for sensors is proposed in this paper. It carries out gain and offset compensation by adding or subtracting appropriate correction factors to the transfer function of each sensor. Digital programmability makes it possible to automate calibration, paving the way for batch calibration. The circuit was designed for a specific sensor structure, a MIMISFET, which was modeled in HSpice. The proposed scheme reduces the offset and gain error due to process variations of both the sensor and the readout circuit. Offset error is reduced from 123 to 20 mV and gain error is reduced from 10.6 to 6.4 mV/pH. Relative error is reduced in the whole sensing range from 13 to 4 %. The circuit was designed in a 0.18 μm standard CMOS process, occupies an area of 115 x 100 μm² and consumes 2.3 mW.
publishDate 2013
dc.date.none.fl_str_mv 2013-05-08
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/2319
url http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/2319
dc.language.none.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv citation:Guerrero, E., et al., (2013), Offset and gain calibration circuit for MIM-ISFET devices, Analog Integrated Circuits and Signal Processing, Vol. 76(3): 321–333
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-nd/4.0
eu_rights_str_mv openAccess
rights_invalid_str_mv http://creativecommons.org/licenses/by-nc-nd/4.0
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Analog Integrated Circuits and Signal Processing
publisher.none.fl_str_mv Analog Integrated Circuits and Signal Processing
dc.source.none.fl_str_mv reponame:Repositorio Institucional del INAOE
instname:Instituto Nacional de Astrofísica, Óptica y Electrónica
instacron:INAOE
instname_str Instituto Nacional de Astrofísica, Óptica y Electrónica
instacron_str INAOE
institution INAOE
reponame_str Repositorio Institucional del INAOE
collection Repositorio Institucional del INAOE
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15.812429

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