Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD
Different amounts of oxygen, boron-doped hydrogenated amorphous silicon (a-Si:H) and hydrogenated microcrystalline silicon (µc-Si:H) deposition were carried out using catalytic chemical-vapor deposition (Cat-CVD) process. Pure silane (SiH4), hydrogen (H2), oxygen (O2), and diluted diborane (B2H6) ga...
| Autores: | , |
|---|---|
| Formato: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2008 |
| País: | México |
| Recursos: | Instituto Nacional de Astrofísica, Óptica y Electrónica |
| Repositorio: | Repositorio Institucional del INAOE |
| Idioma: | inglés |
| OAI Identifier: | oai:inaoe.repositorioinstitucional.mx:1009/1108 |
| Acesso em linha: | http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1108 |
| Access Level: | acceso abierto |
| Palavra-chave: | info:eu-repo/classification/Boron-doped silicon oxide/Boron-doped silicon oxide info:eu-repo/classification/Solar cell windows/Solar cell windows info:eu-repo/classification/Catalytic-CVD/Catalytic-CVD info:eu-repo/classification/Microcrystalline silicon/Microcrystalline silicon info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2203 |
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Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVDYASUHIRO MATSUMOTO KUWABARAZHENRUI YUinfo:eu-repo/classification/Boron-doped silicon oxide/Boron-doped silicon oxideinfo:eu-repo/classification/Solar cell windows/Solar cell windowsinfo:eu-repo/classification/Catalytic-CVD/Catalytic-CVDinfo:eu-repo/classification/Microcrystalline silicon/Microcrystalline siliconinfo:eu-repo/classification/cti/1info:eu-repo/classification/cti/22info:eu-repo/classification/cti/2203info:eu-repo/classification/cti/2203Different amounts of oxygen, boron-doped hydrogenated amorphous silicon (a-Si:H) and hydrogenated microcrystalline silicon (µc-Si:H) deposition were carried out using catalytic chemical-vapor deposition (Cat-CVD) process. Pure silane (SiH4), hydrogen (H2), oxygen (O2), and diluted diborane (B2H6) gases were used at the deposition pressure of 0.1–0.5 Torr. The tungsten catalyst temperature (Tfil) was varied from 1700 to 2100 1C. Sample transmittance measurement shows an optical-band gap (Egopt ) variation from 1.45 to 2.1 eV X-ray diffraction (XRD) spectra have revealed silicon microcrystalline phases for the samples prepared at the temperature greater than Tfil~1900 oC. For the used silicon oxide deposition conditions, no strong tungsten filament degradation was observed after a number of sample preparations.Elsevier B.V.2008info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersionapplication/pdfhttp://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1108reponame:Repositorio Institucional del INAOEinstname:Instituto Nacional de Astrofísica, Óptica y Electrónicainstacron:INAOEengcitation:Matsumoto, Y. , et al., (2008). Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD, Solar Energy Materials & Solar Cells (92): 576–580info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-nd/4.0oai:inaoe.repositorioinstitucional.mx:1009/11082024-08-28T03:22:51Z |
| dc.title.none.fl_str_mv |
Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD |
| title |
Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD |
| spellingShingle |
Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD YASUHIRO MATSUMOTO KUWABARA info:eu-repo/classification/Boron-doped silicon oxide/Boron-doped silicon oxide info:eu-repo/classification/Solar cell windows/Solar cell windows info:eu-repo/classification/Catalytic-CVD/Catalytic-CVD info:eu-repo/classification/Microcrystalline silicon/Microcrystalline silicon info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2203 info:eu-repo/classification/cti/2203 |
| title_short |
Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD |
| title_full |
Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD |
| title_fullStr |
Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD |
| title_full_unstemmed |
Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD |
| title_sort |
Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD |
| dc.creator.none.fl_str_mv |
YASUHIRO MATSUMOTO KUWABARA ZHENRUI YU |
| author |
YASUHIRO MATSUMOTO KUWABARA |
| author_facet |
YASUHIRO MATSUMOTO KUWABARA ZHENRUI YU |
| author_role |
author |
| author2 |
ZHENRUI YU |
| author2_role |
author |
| dc.subject.none.fl_str_mv |
info:eu-repo/classification/Boron-doped silicon oxide/Boron-doped silicon oxide info:eu-repo/classification/Solar cell windows/Solar cell windows info:eu-repo/classification/Catalytic-CVD/Catalytic-CVD info:eu-repo/classification/Microcrystalline silicon/Microcrystalline silicon info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2203 info:eu-repo/classification/cti/2203 |
| topic |
info:eu-repo/classification/Boron-doped silicon oxide/Boron-doped silicon oxide info:eu-repo/classification/Solar cell windows/Solar cell windows info:eu-repo/classification/Catalytic-CVD/Catalytic-CVD info:eu-repo/classification/Microcrystalline silicon/Microcrystalline silicon info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2203 info:eu-repo/classification/cti/2203 |
| description |
Different amounts of oxygen, boron-doped hydrogenated amorphous silicon (a-Si:H) and hydrogenated microcrystalline silicon (µc-Si:H) deposition were carried out using catalytic chemical-vapor deposition (Cat-CVD) process. Pure silane (SiH4), hydrogen (H2), oxygen (O2), and diluted diborane (B2H6) gases were used at the deposition pressure of 0.1–0.5 Torr. The tungsten catalyst temperature (Tfil) was varied from 1700 to 2100 1C. Sample transmittance measurement shows an optical-band gap (Egopt ) variation from 1.45 to 2.1 eV X-ray diffraction (XRD) spectra have revealed silicon microcrystalline phases for the samples prepared at the temperature greater than Tfil~1900 oC. For the used silicon oxide deposition conditions, no strong tungsten filament degradation was observed after a number of sample preparations. |
| publishDate |
2008 |
| dc.date.none.fl_str_mv |
2008 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article info:eu-repo/semantics/acceptedVersion |
| format |
article |
| status_str |
acceptedVersion |
| dc.identifier.none.fl_str_mv |
http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1108 |
| url |
http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/1108 |
| dc.language.none.fl_str_mv |
eng |
| language |
eng |
| dc.relation.none.fl_str_mv |
citation:Matsumoto, Y. , et al., (2008). Microcrystalline-phase p-type a-Si:O:H windows prepared by Cat-CVD, Solar Energy Materials & Solar Cells (92): 576–580 |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by-nc-nd/4.0 |
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openAccess |
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http://creativecommons.org/licenses/by-nc-nd/4.0 |
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application/pdf |
| dc.publisher.none.fl_str_mv |
Elsevier B.V. |
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Elsevier B.V. |
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reponame:Repositorio Institucional del INAOE instname:Instituto Nacional de Astrofísica, Óptica y Electrónica instacron:INAOE |
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Instituto Nacional de Astrofísica, Óptica y Electrónica |
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INAOE |
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INAOE |
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Repositorio Institucional del INAOE |
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Repositorio Institucional del INAOE |
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1858177143271325696 |
| score |
15.812429 |