Sensor para la Determinación de la Permitividad Compleja usando Resonadores Acoplados Eléctricamente.
The complex permittivity (ε* = ε₀(ε′r − jε″r )) is one of the most important values for materials characterization, such as dielectrics, semiconductors, magnetics, and even meta-materials. This thesis presents a novel microstrip sensor for determining the complex permittivity of planar samples using...
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| Tipo de recurso: | tesis doctoral |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2021 |
| País: | México |
| Institución: | Instituto Nacional de Astrofísica, Óptica y Electrónica |
| Repositorio: | Repositorio Institucional del INAOE |
| Idioma: | español |
| OAI Identifier: | oai:inaoe.repositorioinstitucional.mx:1009/2166 |
| Acceso en línea: | http://inaoe.repositorioinstitucional.mx/jspui/handle/1009/2166 |
| Access Level: | acceso abierto |
| Palabra clave: | info:eu-repo/classification/Inspec/Resonadores Acoplados Eléctricamente info:eu-repo/classification/Inspec/Sensor en Microcinta info:eu-repo/classification/Inspec/Constante Dieléctrica info:eu-repo/classification/Inspec/Tangente de Pérdidas info:eu-repo/classification/Inspec/Permitividad info:eu-repo/classification/cti/1 info:eu-repo/classification/cti/22 info:eu-repo/classification/cti/2203 |
| Sumario: | The complex permittivity (ε* = ε₀(ε′r − jε″r )) is one of the most important values for materials characterization, such as dielectrics, semiconductors, magnetics, and even meta-materials. This thesis presents a novel microstrip sensor for determining the complex permittivity of planar samples using a pair of electrically coupled resonators (ECR). Additionally, it describes two new sensing methodologies for characterizing the real and imaginary part of the permittivity in such samples. It presents the design, simulation, fabrication, and characterization of the microstrip ECR sensor for measurements of the dielectric constant (ε′r) and loss tangent (tan δ = ε′′r /ε′r ) of different samples. In the first part of the work, it describes the design of the ECR sensor using the general theory of the electrical coupled resonators. Following, it explains the results of different simulations of the ECR sensor, which served to define the operating region of the sensor and as comparison to the experimental results. Regarding the fabrication process, it uses a standard photolithography technique to create the microstrip sensor on a commercial substrate RT/Duroit 5880. It proposes two methodologies ro characterize the planar samples on the ECR sensor, one to determine the ε′′r values, and another to determine the tan δ values. The first methodology relates ε′′r to the electric coupling coefficient by a second-degree polynomial function; and the second, relates tan δ to the quality factor by a linear function. Finally, by thorough comparisons of both the ε′′r and the tan δ obtained values in this work and the found values in the literature, it estimates the accuracy of the measurements as well as the sensitivity and the resolution of the sensor. |
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