Nanocolumnar CdS thin films grown by glancing angle deposition from a sublimate vapor effusion source

The glancing angle Deposition (GLAD) technique was used to grow cadmium sulfide (CdS) thin films on glass and indium tin oxide (ITO) coated glass substrates from a sublimate vapor effusion source. The samples were prepared under different incident deposition flux angles (α) of 0°, 20° and 80°, while...

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Detalles Bibliográficos
Autores: L. G. Daza, R. Castro-Rodríguez, M. Cirerol-Carrillo, E.A. Martín-Tovar, J. Méndez-Gamboa, R. Medina-Esquivel, I. Perez-Quintana, A. Iribarren
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2019
País:México
Institución:Universidad Autónoma de Yucatán
Repositorio:Redalyc-UADY
OAI Identifier:oai:redalyc.org:47471641006
Acceso en línea:https://www.redalyc.org/articulo.oa?id=47471641006
https://www.redalyc.org/journal/474/47471641006/
https://www.redalyc.org/journal/474/47471641006/html/
https://www.redalyc.org/journal/474/47471641006/47471641006.epub
https://www.redalyc.org/journal/474/47471641006/movil
Access Level:acceso abierto
Palabra clave:Ingeniería
Thin film
Nanostructures
Cadmium sulfide
Optical properties
Columnar structure
Descripción
Sumario:The glancing angle Deposition (GLAD) technique was used to grow cadmium sulfide (CdS) thin films on glass and indium tin oxide (ITO) coated glass substrates from a sublimate vapor effusion source. The samples were prepared under different incident deposition flux angles (α) of 0°, 20° and 80°, while both the substrate and the source were under rotation. The temperature of the source was 923.15 K. Scanning electron microscopy images showed that the GLAD method combined with the source produced dense nanocolumnar shaped structures with height and diameters of ~200 and ~30 nm respectively. The deposited films showed a hexagonal structure with preferential (002) plane orientation and crystallites sizes between ~25 nm and ~35 nm. A maximum solar weighted transmission of ~92% was obtained for the sample prepared at α =80°, with a substrate/source rotation velocity ratio of 55/20 in the wavelength region of 400-900 nm. The average band gap energy of the films was 2.42 eV. Refractive indexes between ~1.4 and ~2.4 at a 550 nm the wavelength were also obtained.