Spectroscopic ellipsometry study of Cu2ZnSnSe4 bulk crystals

Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8-4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B...

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Detalles Bibliográficos
Autores: León, Máximo, Levcenko, Sergiu, Serna, Rosalía, Bodnar, Ivan V., Nateprov, A., Guc, Maxim, Gurieva, G., Lopez, N., Merino, José Manuel, Caballero, Raquel, Schorr, S., Pérez Rodríguez, Alejandro, Arushanov, Ernest
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2014
País:España
Institución:Universidad de Barcelona
Repositorio:Dipòsit Digital de la UB
OAI Identifier:oai:diposit.ub.edu:2445/124830
Acceso en línea:https://hdl.handle.net/2445/124830
Access Level:acceso abierto
Palabra clave:Cristal·lografia
El·lipsometria
Crystallography
Ellipsometry
Descripción
Sumario:Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu2ZnSnSe4 bulk crystals, grown by the Bridgman method, over 0.8-4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E0, E1A, and E1B interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8-4.5 eV photon energy range

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