Cathodoluminescence of rare earth implanted AllnN

AlInN layers implanted with europium and erbium ions are systematically studied and compared with similarly implanted GaN. Cathodoluminescence from four series of annealed samples shows that the Eu/Er emissions from AlInN are considerably broader than those from GaN, while the peak positions only ch...

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Detalles Bibliográficos
Autores: Wang, K., Martin, R. W., Nogales Díaz, Emilio, Edwards, P. R., O’Donnell, K. P., Lorenz, K., Alves, E., Watson, I. M.
Tipo de recurso: artículo
Fecha de publicación:2006
País:España
Institución:Universidad Complutense de Madrid (UCM)
Repositorio:Docta Complutense
Idioma:inglés
OAI Identifier:oai:docta.ucm.es:20.500.14352/52124
Acceso en línea:https://hdl.handle.net/20.500.14352/52124
Access Level:acceso abierto
Palabra clave:538.9
Doped Gan
Luminescence
Growth
Física de materiales
Física del estado sólido
2211 Física del Estado Sólido
Descripción
Sumario:AlInN layers implanted with europium and erbium ions are systematically studied and compared with similarly implanted GaN. Cathodoluminescence from four series of annealed samples shows that the Eu/Er emissions from AlInN are considerably broader than those from GaN, while the peak positions only change slightly. The rate of increase of cathodoluminescence intensity with annealing temperature, up to 1300 °C, is analyzed for all four series. For Eu the increase exceeds 10x in both hosts. Although some decomposition is observed for annealing at 1200 degrees C, well above the growth temperature, AlInN is shown to be a surprisingly robust host for rare earth ions.