Single-shot temporal characterization of XUV pulses with duration from ~10 fs to ~350 fs at FLASH

Ultra-short extreme ultraviolet pulses from the free-electron laser FLASH are characterized using terahertz-field driven streaking. Measurements at different ultra-short extreme ultraviolet wavelengths and pulse durations as well as numerical simulations were performed to explore the application ran...

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Detalles Bibliográficos
Autores: Ivanov, Rosen, Bermúdez Macias, Ivette J., Liu, Jia, Brenner, Günter, Roensch-Schulenburg, Juliane, Kurdi, Gabor, Frühling, Ulrike, Wenig, Katharina, Walther, Sophie, Dimitriou, Anastasios, Drescher, Markus, Sazhina, Irina P., Kazansky, Andrey K., Kabachnik, Nikolay M., Düsterer, Stefan
Tipo de recurso: artículo
Fecha de publicación:2020
País:España
Institución:Universidad del País Vasco
Repositorio:Addi. Archivo Digital para la Docencia y la Investigación
OAI Identifier:oai:addi.ehu.eus:10810/47623
Acceso en línea:http://hdl.handle.net/10810/47623
Access Level:acceso abierto
Palabra clave:temporal diagnostic
XUV pulses
SASE FEL
FLASH
THz streaking
single cycle terahertz pulse
free-electron laser
x-ray pulses
field
performance
operation
streaking
Descripción
Sumario:Ultra-short extreme ultraviolet pulses from the free-electron laser FLASH are characterized using terahertz-field driven streaking. Measurements at different ultra-short extreme ultraviolet wavelengths and pulse durations as well as numerical simulations were performed to explore the application range and accuracy of the method. For the simulation of streaking, a standard classical approach is used which is compared to quantum mechanical theory, based on strong field approximation. Various factors limiting the temporal resolution of the presented terahertz streaking setup are investigated and discussed. Special attention is paid to the cases of very short (similar to 10 fs) and long (up to similar to 350 fs) pulses.

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