Polarization tagging of two-photon double ionization by elliptically polarized XUV pulses

We explore the influence of elliptical polarization on the (non)sequential two-photon double ionization of atomic helium with ultrashort extreme ultraviolet (XUV) light fields using time-dependent full ab initio simulations. The energy and angular distributions of photoelectrons are found to be stro...

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Detalles Bibliográficos
Autores: Donsa, Stefan, Březinová, Iva, Ni, Hongcheng, Feist, Johannes, Burgdörfer, Joachim
Tipo de recurso: artículo
Fecha de publicación:2019
País:España
Institución:Universidad Autónoma de Madrid
Repositorio:Biblos-e Archivo. Repositorio Institucional de la UAM
Idioma:inglés
OAI Identifier:oai:repositorio.uam.es:10486/688403
Acceso en línea:http://hdl.handle.net/10486/688403
https://dx.doi.org/10.1103/PhysRevA.99.023413
Access Level:acceso abierto
Palabra clave:Photoemission
Ultrafast phenomena
Ultrashort pulses
Single and few-photon ionization & excitation
Física
Descripción
Sumario:We explore the influence of elliptical polarization on the (non)sequential two-photon double ionization of atomic helium with ultrashort extreme ultraviolet (XUV) light fields using time-dependent full ab initio simulations. The energy and angular distributions of photoelectrons are found to be strongly dependent on the ellipticity. The correlation minimum in the joint angular distribution becomes more prominently visible with increasing ellipticity. In a pump-probe sequence of two subsequent XUV pulses with varying ellipticities, polarization tagging allows us to discriminate between sequential and nonsequential photoionization. This clear separation demonstrates the potential of elliptically polarized XUV fields for improved control of electronic emission processes.