An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators
In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perf...
| Autores: | , , , , , , |
|---|---|
| Tipo de recurso: | artículo |
| Fecha de publicación: | 2004 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/3794 |
| Acceso en línea: | http://hdl.handle.net/10261/3794 |
| Access Level: | acceso abierto |
| Palabra clave: | Design for Testability Sigma-Delta Modulators |
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An Alternative DfT Methodology to Test High-Resolution ΣΔ ModulatorsEscalera, SaraGarcía-González, José ManuelGuerra, OscarRosa, José M. de laMedeiro, FernandoPérez-Verdú, BelénRodríguez-Vázquez, ÁngelDesign for TestabilitySigma-Delta ModulatorsIn this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach.Peer reviewedInstitute of Electrical and Electronics Engineers200820082004info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501450773 bytesapplication/pdfhttp://hdl.handle.net/10261/3794reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglésinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/37942026-05-22T06:33:51Z |
| dc.title.none.fl_str_mv |
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators |
| title |
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators |
| spellingShingle |
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators Escalera, Sara Design for Testability Sigma-Delta Modulators |
| title_short |
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators |
| title_full |
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators |
| title_fullStr |
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators |
| title_full_unstemmed |
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators |
| title_sort |
An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators |
| dc.creator.none.fl_str_mv |
Escalera, Sara García-González, José Manuel Guerra, Oscar Rosa, José M. de la Medeiro, Fernando Pérez-Verdú, Belén Rodríguez-Vázquez, Ángel |
| author |
Escalera, Sara |
| author_facet |
Escalera, Sara García-González, José Manuel Guerra, Oscar Rosa, José M. de la Medeiro, Fernando Pérez-Verdú, Belén Rodríguez-Vázquez, Ángel |
| author_role |
author |
| author2 |
García-González, José Manuel Guerra, Oscar Rosa, José M. de la Medeiro, Fernando Pérez-Verdú, Belén Rodríguez-Vázquez, Ángel |
| author2_role |
author author author author author author |
| dc.subject.none.fl_str_mv |
Design for Testability Sigma-Delta Modulators |
| topic |
Design for Testability Sigma-Delta Modulators |
| description |
In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach. |
| publishDate |
2004 |
| dc.date.none.fl_str_mv |
2004 2008 2008 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article http://purl.org/coar/resource_type/c_6501 |
| format |
article |
| dc.identifier.none.fl_str_mv |
http://hdl.handle.net/10261/3794 |
| url |
http://hdl.handle.net/10261/3794 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
| dc.format.none.fl_str_mv |
450773 bytes application/pdf |
| dc.publisher.none.fl_str_mv |
Institute of Electrical and Electronics Engineers |
| publisher.none.fl_str_mv |
Institute of Electrical and Electronics Engineers |
| dc.source.none.fl_str_mv |
reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC instname:Consejo Superior de Investigaciones Científicas (CSIC) |
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Consejo Superior de Investigaciones Científicas (CSIC) |
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DIGITAL.CSIC. Repositorio Institucional del CSIC |
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DIGITAL.CSIC. Repositorio Institucional del CSIC |
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15,81155 |