An Alternative DfT Methodology to Test High-Resolution ΣΔ Modulators
In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perf...
| Autores: | , , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2004 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/3794 |
| Acceso en línea: | http://hdl.handle.net/10261/3794 |
| Access Level: | acceso abierto |
| Palabra clave: | Design for Testability Sigma-Delta Modulators |
| Sumario: | In this paper, a novel DfT methodology to test high-resolution ΣΔ Modulators (ΣΔM) is introduced. The aim of the proposal is to reduce the test time required by conventional methodologies without degrading the accuracy of the results. A detailed description of the additional circuitry needed to perform these tests is presented as well as some initial simulation results to show the utility of the approach. |
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