Application of dielectric resonators to surface impedance measurements of microwave susceptors

[EN] This paper describes the application of dielectric resonators (DR) to the measurements of surface impedance of microwave susceptors. We demonstrate that the single-post (SiPDR) configuration is applicable to plain susceptors before use, while the split-post (SPDR) configuration - to crazed susc...

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Bibliographic Details
Authors: Celuch, Malgorzata, Rudnicki, Janusz, Krupka, Jerzy, Gwarek, Wojciech
Format: book part
Publication Date:2019
Country:España
Institution:Universitat Politècnica de València (UPV)
Repository:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
Language:English
OAI Identifier:oai:riunet.upv.es:10251/130739
Online Access:https://riunet.upv.es/handle/10251/130739
Access Level:Open access
Keyword:Energy Production by Microwaves
Microwave CVD
EM Modelling
Microwave Material interaction
Dielectric Properties
Dielectric Properties Measurement
Solid State Microwave
Microwave Processing
Microwave Chemistry
Microwave applicators design
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spelling Application of dielectric resonators to surface impedance measurements of microwave susceptorsCeluch, MalgorzataRudnicki, JanuszKrupka, JerzyGwarek, WojciechEnergy Production by MicrowavesMicrowave CVDEM ModellingMicrowave Material interactionDielectric PropertiesDielectric Properties MeasurementSolid State MicrowaveMicrowave ProcessingMicrowave ChemistryMicrowave applicators design[EN] This paper describes the application of dielectric resonators (DR) to the measurements of surface impedance of microwave susceptors. We demonstrate that the single-post (SiPDR) configuration is applicable to plain susceptors before use, while the split-post (SPDR) configuration - to crazed susceptors after use. Attention is given to the full characterisation of active packaging, that is, the influence of paper support on the overall electric losses is also investigated. The measurements can be preformed with various form-factor VNAs, including benchtop VNAs and hand-held FieldFox, though the most economical setup is constructed with a dedicated computer-controlled microwave signal oscillator system available under the name of Q-Meter. Finally, an extension of dielectric resonator measurements to surface imaging is presented, achieved by incorporating the resonator in a 2D automatic scanner.This project has received funding from the European Union’s Horizon 2020 research and innovation programme (H2020-NMBP-07-2017) under grant agreement MMAMA No. 761036.Editorial Universitat Politècnica de ValènciaEuropean CommissionRepositorio Institucional de la Universitat Politècnica de València Riunet20192019-10-15book parthttp://purl.org/coar/resource_type/c_3248VoRhttp://purl.org/coar/version/c_970fb48d4fbd8a85info:eu-repo/semantics/bookPartapplication/pdfhttps://riunet.upv.es/handle/10251/130739reponame:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valénciainstname:Universitat Politècnica de València (UPV)InglésengEuropean Commission https://doi.org/10.13039/501100000780 H2020 761036 Microwave Microscopy for Advanced and Efficient Materials Analysis and Productionopen accesshttp://purl.org/coar/access_right/c_abf2Reconocimiento - No comercial - Sin obra derivada (by-nc-nd) http://creativecommons.org/licenses/by-nc-nd/4.0/info:eu-repo/semantics/openAccessoai:riunet.upv.es:10251/1307392026-06-13T07:49:27Z
dc.title.none.fl_str_mv Application of dielectric resonators to surface impedance measurements of microwave susceptors
title Application of dielectric resonators to surface impedance measurements of microwave susceptors
spellingShingle Application of dielectric resonators to surface impedance measurements of microwave susceptors
Celuch, Malgorzata
Energy Production by Microwaves
Microwave CVD
EM Modelling
Microwave Material interaction
Dielectric Properties
Dielectric Properties Measurement
Solid State Microwave
Microwave Processing
Microwave Chemistry
Microwave applicators design
title_short Application of dielectric resonators to surface impedance measurements of microwave susceptors
title_full Application of dielectric resonators to surface impedance measurements of microwave susceptors
title_fullStr Application of dielectric resonators to surface impedance measurements of microwave susceptors
title_full_unstemmed Application of dielectric resonators to surface impedance measurements of microwave susceptors
title_sort Application of dielectric resonators to surface impedance measurements of microwave susceptors
dc.creator.none.fl_str_mv Celuch, Malgorzata
Rudnicki, Janusz
Krupka, Jerzy
Gwarek, Wojciech
author Celuch, Malgorzata
author_facet Celuch, Malgorzata
Rudnicki, Janusz
Krupka, Jerzy
Gwarek, Wojciech
author_role author
author2 Rudnicki, Janusz
Krupka, Jerzy
Gwarek, Wojciech
author2_role author
author
author
dc.contributor.none.fl_str_mv European Commission
Repositorio Institucional de la Universitat Politècnica de València Riunet
dc.subject.none.fl_str_mv Energy Production by Microwaves
Microwave CVD
EM Modelling
Microwave Material interaction
Dielectric Properties
Dielectric Properties Measurement
Solid State Microwave
Microwave Processing
Microwave Chemistry
Microwave applicators design
topic Energy Production by Microwaves
Microwave CVD
EM Modelling
Microwave Material interaction
Dielectric Properties
Dielectric Properties Measurement
Solid State Microwave
Microwave Processing
Microwave Chemistry
Microwave applicators design
description [EN] This paper describes the application of dielectric resonators (DR) to the measurements of surface impedance of microwave susceptors. We demonstrate that the single-post (SiPDR) configuration is applicable to plain susceptors before use, while the split-post (SPDR) configuration - to crazed susceptors after use. Attention is given to the full characterisation of active packaging, that is, the influence of paper support on the overall electric losses is also investigated. The measurements can be preformed with various form-factor VNAs, including benchtop VNAs and hand-held FieldFox, though the most economical setup is constructed with a dedicated computer-controlled microwave signal oscillator system available under the name of Q-Meter. Finally, an extension of dielectric resonator measurements to surface imaging is presented, achieved by incorporating the resonator in a 2D automatic scanner.
publishDate 2019
dc.date.none.fl_str_mv 2019
2019-10-15
dc.type.none.fl_str_mv book part
http://purl.org/coar/resource_type/c_3248
VoR
http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.openaire.fl_str_mv info:eu-repo/semantics/bookPart
format bookPart
dc.identifier.none.fl_str_mv https://riunet.upv.es/handle/10251/130739
url https://riunet.upv.es/handle/10251/130739
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.relation.none.fl_str_mv European Commission https://doi.org/10.13039/501100000780 H2020 761036 Microwave Microscopy for Advanced and Efficient Materials Analysis and Production
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
Reconocimiento - No comercial - Sin obra derivada (by-nc-nd)
http://creativecommons.org/licenses/by-nc-nd/4.0/
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
Reconocimiento - No comercial - Sin obra derivada (by-nc-nd)
http://creativecommons.org/licenses/by-nc-nd/4.0/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Editorial Universitat Politècnica de València
publisher.none.fl_str_mv Editorial Universitat Politècnica de València
dc.source.none.fl_str_mv reponame:RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
instname:Universitat Politècnica de València (UPV)
instname_str Universitat Politècnica de València (UPV)
reponame_str RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
collection RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,301603

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