Application of dielectric resonators to surface impedance measurements of microwave susceptors
[EN] This paper describes the application of dielectric resonators (DR) to the measurements of surface impedance of microwave susceptors. We demonstrate that the single-post (SiPDR) configuration is applicable to plain susceptors before use, while the split-post (SPDR) configuration - to crazed susc...
| Authors: | , , , |
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| Format: | book part |
| Publication Date: | 2019 |
| Country: | España |
| Institution: | Universitat Politècnica de València (UPV) |
| Repository: | RiuNet. Repositorio Institucional de la Universitat Politécnica de Valéncia |
| Language: | English |
| OAI Identifier: | oai:riunet.upv.es:10251/130739 |
| Online Access: | https://riunet.upv.es/handle/10251/130739 |
| Access Level: | Open access |
| Keyword: | Energy Production by Microwaves Microwave CVD EM Modelling Microwave Material interaction Dielectric Properties Dielectric Properties Measurement Solid State Microwave Microwave Processing Microwave Chemistry Microwave applicators design |
| Summary: | [EN] This paper describes the application of dielectric resonators (DR) to the measurements of surface impedance of microwave susceptors. We demonstrate that the single-post (SiPDR) configuration is applicable to plain susceptors before use, while the split-post (SPDR) configuration - to crazed susceptors after use. Attention is given to the full characterisation of active packaging, that is, the influence of paper support on the overall electric losses is also investigated. The measurements can be preformed with various form-factor VNAs, including benchtop VNAs and hand-held FieldFox, though the most economical setup is constructed with a dedicated computer-controlled microwave signal oscillator system available under the name of Q-Meter. Finally, an extension of dielectric resonator measurements to surface imaging is presented, achieved by incorporating the resonator in a 2D automatic scanner. |
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