Reverse Leakage Current Hysteresis in GaN Schottky Barrier Diodes Interpreted in Terms of a Trap Energy Band

[EN]The hysteresis cycles observed in the reverse leakage current measured at low temperatures in GaN-on-Sapphire Schottky Barrier Diodes (SBDs) have been deeply studied and interpreted in terms of trap-assisted tunneling compatible with the existence of a trap energy band near the metal-semiconduct...

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Detalles Bibliográficos
Autores: Peña, R. A., Orfao, B., Íñiguez-de-la-Torre, I., Paz, G., Daher, M. A., Roelens, Y., Zaknoune, M., Mateos, J., González, T., Vasallo, B. G., Pérez, S.
Tipo de recurso: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2024
País:España
Institución:Universidad de Salamanca (USAL)
Repositorio:GREDOS. Repositorio Institucional de la Universidad de Salamanca
OAI Identifier:oai:gredos.usal.es:10366/160314
Acceso en línea:http://hdl.handle.net/10366/160314
Access Level:acceso abierto
Palabra clave:Schottky barrier diode
GaN technologies
Trapping effects
Cryogenic temperatures
3307.92 Microelectrónica. Tecnologías III-V y Alternativas
3307 Tecnología Electrónica
Descripción
Sumario:[EN]The hysteresis cycles observed in the reverse leakage current measured at low temperatures in GaN-on-Sapphire Schottky Barrier Diodes (SBDs) have been deeply studied and interpreted in terms of trap-assisted tunneling compatible with the existence of a trap energy band near the metal-semiconductor interface. The analysis of the energies for which the maximum tunneling current occurs, both direct and through this trap band, allows us to explain the behaviors found at different temperatures. Starting from empty trap states by previous illumination, transient current measurements performed under different preconditioning voltages evidence a progressive partial filling/release of the trap energy levels, confirmed as well by pulsed measurements. Captured/released electrons modify the number of trap states available for tunneling and thus the current level. As a consequence, tunneling processes in the go and return paths take place through levels with different occupation within the trap energy band, originating the hysteresis cycle.