XPS Characterization of Transparent Conductive Oxide based on doped ZnO films

This work presents an elemental characterization of vanadium-doped zinc oxide (ZnO:V) thin films, deposited by atomic layer deposition (ALD), for use as transparent conductive oxides (TCO) in transparent photovoltaic cells. This characterization has been carried out by X-ray Photoelectron Spectrosco...

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Detalhes bibliográficos
Autor: López Pujalte, Santi
Formato: tesis de maestría
Fecha de publicación:2025
País:España
Recursos:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/451871
Acesso em linha:https://hdl.handle.net/2117/451871
Access Level:acceso abierto
Palavra-chave:Photovoltaic cells
Zinc oxide
XPS
ALD
ZnO
ZnO:V
TCO
Cèl·lules fotovoltaiques
Òxid de zinc
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oai_identifier_str oai:upcommons.upc.edu:2117/451871
network_acronym_str ES
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repository_id_str
spelling XPS Characterization of Transparent Conductive Oxide based on doped ZnO filmsXPS Characterization of Transparent Conductive Oxide based on doped ZnO filmsLópez Pujalte, SantiPhotovoltaic cellsZinc oxideXPSALDZnOZnO:VTCOCèl·lules fotovoltaiquesÒxid de zincThis work presents an elemental characterization of vanadium-doped zinc oxide (ZnO:V) thin films, deposited by atomic layer deposition (ALD), for use as transparent conductive oxides (TCO) in transparent photovoltaic cells. This characterization has been carried out by X-ray Photoelectron Spectroscopy (XPS), in order to analyse the effect of the doping level and deposition temperature on the chemical composition and oxidation states of the samples. The combination of this XPS-based study with other techniques, such as TEM or UPS, provides a deeper understanding of the optical and electronic behaviour of these films, supporting ZnO:V as a promising alternative to conventional TCO materials such as indium tin oxide (ITO).Universitat Politècnica de CatalunyaMasmitjà Rusiñol, Gerard20252025-07-0920262026-01-28master thesishttp://purl.org/coar/resource_type/c_bdccNAhttp://purl.org/coar/version/c_be7fb7dd8ff6fe43info:eu-repo/semantics/masterThesisapplication/pdfhttps://hdl.handle.net/2117/451871reponame:UPCommons. Portal del coneixement obert de la UPCinstname:Universitat Politècnica de Catalunya (UPC)Inglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:upcommons.upc.edu:2117/4518712026-05-27T15:37:01Z
dc.title.none.fl_str_mv XPS Characterization of Transparent Conductive Oxide based on doped ZnO films
XPS Characterization of Transparent Conductive Oxide based on doped ZnO films
title XPS Characterization of Transparent Conductive Oxide based on doped ZnO films
spellingShingle XPS Characterization of Transparent Conductive Oxide based on doped ZnO films
López Pujalte, Santi
Photovoltaic cells
Zinc oxide
XPS
ALD
ZnO
ZnO:V
TCO
Cèl·lules fotovoltaiques
Òxid de zinc
title_short XPS Characterization of Transparent Conductive Oxide based on doped ZnO films
title_full XPS Characterization of Transparent Conductive Oxide based on doped ZnO films
title_fullStr XPS Characterization of Transparent Conductive Oxide based on doped ZnO films
title_full_unstemmed XPS Characterization of Transparent Conductive Oxide based on doped ZnO films
title_sort XPS Characterization of Transparent Conductive Oxide based on doped ZnO films
dc.creator.none.fl_str_mv López Pujalte, Santi
author López Pujalte, Santi
author_facet López Pujalte, Santi
author_role author
dc.contributor.none.fl_str_mv Masmitjà Rusiñol, Gerard
dc.subject.none.fl_str_mv Photovoltaic cells
Zinc oxide
XPS
ALD
ZnO
ZnO:V
TCO
Cèl·lules fotovoltaiques
Òxid de zinc
topic Photovoltaic cells
Zinc oxide
XPS
ALD
ZnO
ZnO:V
TCO
Cèl·lules fotovoltaiques
Òxid de zinc
description This work presents an elemental characterization of vanadium-doped zinc oxide (ZnO:V) thin films, deposited by atomic layer deposition (ALD), for use as transparent conductive oxides (TCO) in transparent photovoltaic cells. This characterization has been carried out by X-ray Photoelectron Spectroscopy (XPS), in order to analyse the effect of the doping level and deposition temperature on the chemical composition and oxidation states of the samples. The combination of this XPS-based study with other techniques, such as TEM or UPS, provides a deeper understanding of the optical and electronic behaviour of these films, supporting ZnO:V as a promising alternative to conventional TCO materials such as indium tin oxide (ITO).
publishDate 2025
dc.date.none.fl_str_mv 2025
2025-07-09
2026
2026-01-28
dc.type.none.fl_str_mv master thesis
http://purl.org/coar/resource_type/c_bdcc
NA
http://purl.org/coar/version/c_be7fb7dd8ff6fe43
dc.type.openaire.fl_str_mv info:eu-repo/semantics/masterThesis
format masterThesis
dc.identifier.none.fl_str_mv https://hdl.handle.net/2117/451871
url https://hdl.handle.net/2117/451871
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Universitat Politècnica de Catalunya
publisher.none.fl_str_mv Universitat Politècnica de Catalunya
dc.source.none.fl_str_mv reponame:UPCommons. Portal del coneixement obert de la UPC
instname:Universitat Politècnica de Catalunya (UPC)
instname_str Universitat Politècnica de Catalunya (UPC)
reponame_str UPCommons. Portal del coneixement obert de la UPC
collection UPCommons. Portal del coneixement obert de la UPC
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869422510555004928
score 15.812429

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