Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared Photodetectors

UV−vis absorption measurements were performed with a Cary 5000 UV−vis−NIR spectrometer in solution. For photoluminescence (PL) measure-ments, a four-channel Thorlabs laser was used as the excitation light and a Kymera 328i spectrograph (Oxford Instruments, Andor) was used as the detector (<1600 n...

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Detalhes bibliográficos
Autores: Peng, Luncheng, Wang, Yongjie, Ren, Yurong, Wang, Zhuoran, Konstantatos, Gerasimos
Formato: conjunto de datos
Fecha de publicación:2024
País:España
Recursos:Consorci de Serveis Universitaris de Catalunya (CSUC)
Repositorio:CORA.Repositori de Dades de Recerca
OAI Identifier:oai:dnet:cora.rdr____::028801f8462371b76244e6ddb978b2ce
Acesso em linha:https://doi.org/10.34810/DATA1799
Access Level:acceso abierto
Palavra-chave:Physics
Quantum dots
Photodetectors
Colloids
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spelling Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared PhotodetectorsPeng, LunchengWang, YongjieRen, YurongWang, ZhuoranKonstantatos, GerasimosPhysicsQuantum dotsPhotodetectorsColloidsUV−vis absorption measurements were performed with a Cary 5000 UV−vis−NIR spectrometer in solution. For photoluminescence (PL) measure-ments, a four-channel Thorlabs laser was used as the excitation light and a Kymera 328i spectrograph (Oxford Instruments, Andor) was used as the detector (<1600 nm). For PLQY measurement, a 935 nm laser, an integration sphere, and an Andor detector were used. The XRD data were collected using a Rigaku SmartLab powder diffractometer in the Bragg−Brentano geometry with Cu Kα radiation on drop-casted powder samples. The TEM images were obtained using a JEOL 2100F microscope operating at an accelerating voltage of 200 kV. TEM samples were prepared by dropping a diluted QD solution on ultrathin carbon grids. Scanning transmission electron microscopy (STEM) experiments were conducted using an FEI Titan G2 80-200 microscope at 200 kV equipped with a Cs-probe corrector and a HAADF detector. Elemental maps were taken by energy-dispersive X-ray spectroscopy (EDX) using four large-solid-angle symmetrical Si drift detectors. The XPS/UPS measurements were performed with a SPECS PHOIBOS 150 hemispherical analyzer under ultrahigh-vacuum conditions (10−10 mbar) with a monochromatic Kα X-ray source (1,486.74 eV). Current−voltage (I−V) measurements were performed with a Keysight Semiconductor Parameter Analyzer (B1500A) with the devices kept in a shield box. The EQE was measured using a Newport Cornerstone 260 monochromator, a Thorlabs MC2000 chopper, a Stanford Research SR570 transimpedance amplifier, and a Stanford Research SR830 lock-in amplifier. Calibrated Newport 818-UV and 818-IR photo- detectors were used as the reference. The nanosecond laser (520 nm) was used as incident light, which was modulated by a waveform generator (Agilent 33220A) at various frequencies with a 50% duty cycle to measure the 3dB bandwidth. For linear dynamic range measurements, a four-channel laser (Thorlabs) at 1310 nm was used as a light source at a frequency of 7 Hz modulated by an Agilent waveform generator. For the noise measurements, devices were connected with a Stanford Research SR830 lock-in amplifier directly.CORA.Repositori de Dades de RecercaCamps, Ferran2024info:eu-repo/semantics/datasethttps://doi.org/10.34810/DATA1799reponame:CORA.Repositori de Dades de Recercainstname:Consorci de Serveis Universitaris de Catalunya (CSUC)Inglésinfo:eu-repo/semantics/openAccessCC0 1.0oai:dnet:cora.rdr____::028801f8462371b76244e6ddb978b2ce2026-06-17T12:20:17Z
dc.title.none.fl_str_mv Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared Photodetectors
title Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared Photodetectors
spellingShingle Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared Photodetectors
Peng, Luncheng
Physics
Quantum dots
Photodetectors
Colloids
title_short Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared Photodetectors
title_full Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared Photodetectors
title_fullStr Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared Photodetectors
title_full_unstemmed Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared Photodetectors
title_sort Replication Data for: InSb/InP Core-Shell Colloidal Quantum Dots for Sensitive and Fast Short-Wave Infrared Photodetectors
dc.creator.none.fl_str_mv Peng, Luncheng
Wang, Yongjie
Ren, Yurong
Wang, Zhuoran
Konstantatos, Gerasimos
author Peng, Luncheng
author_facet Peng, Luncheng
Wang, Yongjie
Ren, Yurong
Wang, Zhuoran
Konstantatos, Gerasimos
author_role author
author2 Wang, Yongjie
Ren, Yurong
Wang, Zhuoran
Konstantatos, Gerasimos
author2_role author
author
author
author
dc.contributor.none.fl_str_mv Camps, Ferran
dc.subject.none.fl_str_mv Physics
Quantum dots
Photodetectors
Colloids
topic Physics
Quantum dots
Photodetectors
Colloids
description UV−vis absorption measurements were performed with a Cary 5000 UV−vis−NIR spectrometer in solution. For photoluminescence (PL) measure-ments, a four-channel Thorlabs laser was used as the excitation light and a Kymera 328i spectrograph (Oxford Instruments, Andor) was used as the detector (<1600 nm). For PLQY measurement, a 935 nm laser, an integration sphere, and an Andor detector were used. The XRD data were collected using a Rigaku SmartLab powder diffractometer in the Bragg−Brentano geometry with Cu Kα radiation on drop-casted powder samples. The TEM images were obtained using a JEOL 2100F microscope operating at an accelerating voltage of 200 kV. TEM samples were prepared by dropping a diluted QD solution on ultrathin carbon grids. Scanning transmission electron microscopy (STEM) experiments were conducted using an FEI Titan G2 80-200 microscope at 200 kV equipped with a Cs-probe corrector and a HAADF detector. Elemental maps were taken by energy-dispersive X-ray spectroscopy (EDX) using four large-solid-angle symmetrical Si drift detectors. The XPS/UPS measurements were performed with a SPECS PHOIBOS 150 hemispherical analyzer under ultrahigh-vacuum conditions (10−10 mbar) with a monochromatic Kα X-ray source (1,486.74 eV). Current−voltage (I−V) measurements were performed with a Keysight Semiconductor Parameter Analyzer (B1500A) with the devices kept in a shield box. The EQE was measured using a Newport Cornerstone 260 monochromator, a Thorlabs MC2000 chopper, a Stanford Research SR570 transimpedance amplifier, and a Stanford Research SR830 lock-in amplifier. Calibrated Newport 818-UV and 818-IR photo- detectors were used as the reference. The nanosecond laser (520 nm) was used as incident light, which was modulated by a waveform generator (Agilent 33220A) at various frequencies with a 50% duty cycle to measure the 3dB bandwidth. For linear dynamic range measurements, a four-channel laser (Thorlabs) at 1310 nm was used as a light source at a frequency of 7 Hz modulated by an Agilent waveform generator. For the noise measurements, devices were connected with a Stanford Research SR830 lock-in amplifier directly.
publishDate 2024
dc.date.none.fl_str_mv 2024
dc.type.none.fl_str_mv info:eu-repo/semantics/dataset
format dataset
dc.identifier.none.fl_str_mv https://doi.org/10.34810/DATA1799
url https://doi.org/10.34810/DATA1799
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
CC0 1.0
eu_rights_str_mv openAccess
rights_invalid_str_mv CC0 1.0
dc.publisher.none.fl_str_mv CORA.Repositori de Dades de Recerca
publisher.none.fl_str_mv CORA.Repositori de Dades de Recerca
dc.source.none.fl_str_mv reponame:CORA.Repositori de Dades de Recerca
instname:Consorci de Serveis Universitaris de Catalunya (CSUC)
instname_str Consorci de Serveis Universitaris de Catalunya (CSUC)
reponame_str CORA.Repositori de Dades de Recerca
collection CORA.Repositori de Dades de Recerca
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,198674

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