Lattice dynamics of wurtzite and rocksalt AlN under high pressure: Effect of compression on the crystal anisotropy of wurtzite-type semiconductors

Raman spectra of aluminum nitride (AlN) under pressure have been measured up to 25GPa, i.e., beyond the onset of the wurtzite-to-rocksalt phase transition around 20GPa. The experimental pressure coefficients for all the Raman-active modes of the wurtzite phase are reported and compared to those obta...

ver descrição completa

Detalhes bibliográficos
Autor: Serrano Gutiérrez, Jorge
Formato: artículo
Estado:Versión publicada
Fecha de publicación:2008
País:España
Recursos:Universidad de Valladolid
Repositorio:UVaDOC. Repositorio Documental de la Universidad de Valladolid
OAI Identifier:oai:uvadoc.uva.es:10324/65306
Acesso em linha:https://doi.org/10.1103/PhysRevB.77.205204
https://uvadoc.uva.es/handle/10324/65306
Access Level:acceso abierto
Descrição
Resumo:Raman spectra of aluminum nitride (AlN) under pressure have been measured up to 25GPa, i.e., beyond the onset of the wurtzite-to-rocksalt phase transition around 20GPa. The experimental pressure coefficients for all the Raman-active modes of the wurtzite phase are reported and compared to those obtained from ab initio lattice dynamical calculations, as well as to previous experimental and theoretical results. The pressure coefficients of all the Raman-active modes in wurtzite-type semiconductors (AlN, GaN, InN, ZnO, and BeO), as well as the relatively low bulk modulus and phase transition pressure in wurtzite AlN, are discussed in the light of the pressure dependence of the structural crystal anisotropy in wurtzite semiconductors. On pressure release, AlN partially returns to the wurtzite phase below 1.3GPa but the presence of a rocksalt phase in AlN was observed at pressures as low as 1.3GPa, as evidenced by comparing the experimental Raman spectra to calculated one- and two-phonon densities of states of the rocksalt phase.