Properties of Nanocrystalline Silicon Probed by Optomechanics

Nanocrystalline materials exhibit properties that can differ substantially from those of their single crystal counterparts. As such, they provide ways to enhance and optimize their functionality for devices and applications. Here, we report on the optical, mechanical and thermal properties of nanocr...

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Autores: Navarro Urrios, Daniel, Colombano, Martín F., Maire, Jérémie, Chavez Ángel, Emigdio, Arregui, Guillermo, Capuj, Néstor E., Devos, Arnaud, Griol, Amadeu, Bellieres, Laurent, Martínez, Alejandro, Grigoras, Kestutis, Häkkinen, Teija, Saarilahti, Jaakko, Makkonen, Tapani, Sotomayor Torres, Clivia M., Ahopelto, Jouni
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2020
País:España
Institución:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
Repositorio:Recercat. Dipósit de la Recerca de Catalunya
OAI Identifier:oai:recercat.cat:2445/179458
Acceso en línea:https://hdl.handle.net/2445/179458
Access Level:acceso abierto
Palabra clave:Ones electromagnètiques
Silici
Electromagnetic waves
Silicon
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spelling Properties of Nanocrystalline Silicon Probed by OptomechanicsNavarro Urrios, DanielColombano, Martín F.Maire, JérémieChavez Ángel, EmigdioArregui, GuillermoCapuj, Néstor E.Devos, ArnaudGriol, AmadeuBellieres, LaurentMartínez, AlejandroGrigoras, KestutisHäkkinen, TeijaSaarilahti, JaakkoMakkonen, TapaniSotomayor Torres, Clivia M.Ahopelto, JouniOnes electromagnètiquesSiliciElectromagnetic wavesSiliconNanocrystalline materials exhibit properties that can differ substantially from those of their single crystal counterparts. As such, they provide ways to enhance and optimize their functionality for devices and applications. Here, we report on the optical, mechanical and thermal properties of nanocrystalline silicon probed by means of optomechanical nanobeams to extract information of the dynamics of optical absorption, mechanical losses, heat generation and dissipation. The optomechanical nanobeams are fabricated using nanocrystalline films prepared by annealing amorphous silicon layers at different temperatures. The resulting crystallite sizes and the stress in the films can be controlled by the annealing temperature and time and, consequently, the properties of the films can be tuned relatively freely, as demonstrated here by means of electron microscopy and Raman scattering. We show that the nanocrystallite size and the volume fraction of the grain boundaries play a key role in the dissipation rates through nonlinear optical and thermal processes. Promising optical (13,000) and mechanical (1700) quality factors were found in the optomechanical cavity realized in the nanocrystalline Si resulting from annealing at 950°C. The enhanced absorption and recombination rates via the intragap states and the reduced thermal conductivity boost the potential to exploit these nonlinear effects in applications including Nanoelectromechanical systems (NEMS), phonon lasing and chaos-based devices.De Gruyter2021202120202021info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersion11 p.application/pdfhttps://hdl.handle.net/2445/179458Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)reponame:Recercat. Dipósit de la Recerca de Catalunyainstname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)InglésReproducció del document publicat a: https://doi.org/10.1515/nanoph-2020-0489Nanophotonics, 2020, vol. 9, num. 16, p. 4819-4829https://doi.org/10.1515/nanoph-2020-0489info:eu-repo/grantAgreement/EC/H2020/713450cc-by (c) Navarro Urrios, Daniel et al., 2020https://creativecommons.org/licenses/by/4.0/info:eu-repo/semantics/openAccessoai:recercat.cat:2445/1794582026-05-29T05:05:01Z
dc.title.none.fl_str_mv Properties of Nanocrystalline Silicon Probed by Optomechanics
title Properties of Nanocrystalline Silicon Probed by Optomechanics
spellingShingle Properties of Nanocrystalline Silicon Probed by Optomechanics
Navarro Urrios, Daniel
Ones electromagnètiques
Silici
Electromagnetic waves
Silicon
title_short Properties of Nanocrystalline Silicon Probed by Optomechanics
title_full Properties of Nanocrystalline Silicon Probed by Optomechanics
title_fullStr Properties of Nanocrystalline Silicon Probed by Optomechanics
title_full_unstemmed Properties of Nanocrystalline Silicon Probed by Optomechanics
title_sort Properties of Nanocrystalline Silicon Probed by Optomechanics
dc.creator.none.fl_str_mv Navarro Urrios, Daniel
Colombano, Martín F.
Maire, Jérémie
Chavez Ángel, Emigdio
Arregui, Guillermo
Capuj, Néstor E.
Devos, Arnaud
Griol, Amadeu
Bellieres, Laurent
Martínez, Alejandro
Grigoras, Kestutis
Häkkinen, Teija
Saarilahti, Jaakko
Makkonen, Tapani
Sotomayor Torres, Clivia M.
Ahopelto, Jouni
author Navarro Urrios, Daniel
author_facet Navarro Urrios, Daniel
Colombano, Martín F.
Maire, Jérémie
Chavez Ángel, Emigdio
Arregui, Guillermo
Capuj, Néstor E.
Devos, Arnaud
Griol, Amadeu
Bellieres, Laurent
Martínez, Alejandro
Grigoras, Kestutis
Häkkinen, Teija
Saarilahti, Jaakko
Makkonen, Tapani
Sotomayor Torres, Clivia M.
Ahopelto, Jouni
author_role author
author2 Colombano, Martín F.
Maire, Jérémie
Chavez Ángel, Emigdio
Arregui, Guillermo
Capuj, Néstor E.
Devos, Arnaud
Griol, Amadeu
Bellieres, Laurent
Martínez, Alejandro
Grigoras, Kestutis
Häkkinen, Teija
Saarilahti, Jaakko
Makkonen, Tapani
Sotomayor Torres, Clivia M.
Ahopelto, Jouni
author2_role author
author
author
author
author
author
author
author
author
author
author
author
author
author
author
dc.subject.none.fl_str_mv Ones electromagnètiques
Silici
Electromagnetic waves
Silicon
topic Ones electromagnètiques
Silici
Electromagnetic waves
Silicon
description Nanocrystalline materials exhibit properties that can differ substantially from those of their single crystal counterparts. As such, they provide ways to enhance and optimize their functionality for devices and applications. Here, we report on the optical, mechanical and thermal properties of nanocrystalline silicon probed by means of optomechanical nanobeams to extract information of the dynamics of optical absorption, mechanical losses, heat generation and dissipation. The optomechanical nanobeams are fabricated using nanocrystalline films prepared by annealing amorphous silicon layers at different temperatures. The resulting crystallite sizes and the stress in the films can be controlled by the annealing temperature and time and, consequently, the properties of the films can be tuned relatively freely, as demonstrated here by means of electron microscopy and Raman scattering. We show that the nanocrystallite size and the volume fraction of the grain boundaries play a key role in the dissipation rates through nonlinear optical and thermal processes. Promising optical (13,000) and mechanical (1700) quality factors were found in the optomechanical cavity realized in the nanocrystalline Si resulting from annealing at 950°C. The enhanced absorption and recombination rates via the intragap states and the reduced thermal conductivity boost the potential to exploit these nonlinear effects in applications including Nanoelectromechanical systems (NEMS), phonon lasing and chaos-based devices.
publishDate 2020
dc.date.none.fl_str_mv 2020
2021
2021
2021
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2445/179458
url https://hdl.handle.net/2445/179458
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Reproducció del document publicat a: https://doi.org/10.1515/nanoph-2020-0489
Nanophotonics, 2020, vol. 9, num. 16, p. 4819-4829
https://doi.org/10.1515/nanoph-2020-0489
info:eu-repo/grantAgreement/EC/H2020/713450
dc.rights.none.fl_str_mv cc-by (c) Navarro Urrios, Daniel et al., 2020
https://creativecommons.org/licenses/by/4.0/
info:eu-repo/semantics/openAccess
rights_invalid_str_mv cc-by (c) Navarro Urrios, Daniel et al., 2020
https://creativecommons.org/licenses/by/4.0/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 11 p.
application/pdf
dc.publisher.none.fl_str_mv De Gruyter
publisher.none.fl_str_mv De Gruyter
dc.source.none.fl_str_mv Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
reponame:Recercat. Dipósit de la Recerca de Catalunya
instname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
instname_str Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
reponame_str Recercat. Dipósit de la Recerca de Catalunya
collection Recercat. Dipósit de la Recerca de Catalunya
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869420928094437376
score 15,812455

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