Control of the optical properties of silicon and chromium mixed oxides deposited by reactive magnetron sputtering

The development of mixed-oxide thin films allows obtaining materials with better properties than those of the different binary oxides, which makes them suitable for a great number of applications in different fields, such as tribology, optics or microelectronics. In this paper we investigate the dep...

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Detalles Bibliográficos
Autores: Vergara, Lucía, Escobar-Galindo, Ramón, Martínez, R., Sánchez, Olga, Palacio Orcajo, Carlos, Albella Martín, José María
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2011
País:España
Institución:Universidad de Sevilla (US)
Repositorio:idUS. Depósito de Investigación de la Universidad de Sevilla
OAI Identifier:oai:idus.us.es:11441/147415
Acceso en línea:https://hdl.handle.net/11441/147415
https://doi.org/10.1016/j.tsf.2011.01.103
Access Level:acceso abierto
Palabra clave:Reactive magnetron sputtering
Mixed oxides
Optical properties
Descripción
Sumario:The development of mixed-oxide thin films allows obtaining materials with better properties than those of the different binary oxides, which makes them suitable for a great number of applications in different fields, such as tribology, optics or microelectronics. In this paper we investigate the deposition of mixed chromium and silicon oxides deposited by reactive magnetron sputtering with a view to use them as optical coatings with an adjustable refractive index. These films have been characterized by means of Rutherford backscattering spectrometry, Auger electron spectroscopy, X-ray diffraction, scanning electron microscopy, Fourier-transform infrared spectroscopy and spectroscopic ellipsometry so as to determine how the deposition conditions influence the characteristics of the material. We have found that the deposition parameter whose influence determines the properties of the films to a greater extent is the amount of oxygen in the reactive sputtering gas.