On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles

The formation of the porous structure in dc magnetron sputtered amorphous silicon thin films at low temperatures is studied when using helium and/or argon as the processing gas. In each case, a-Si thin films were simultaneously grown at two different locations in the reactor which led to the assembl...

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Autores: Fortio Godinho, Vanda Cristina, Moskovkin, P., Álvarez Molina, Rafael, Caballero Hernández, Jaime, Schierholz, R., Bera, B., Demarche, J., Palmero Acebedo, Alberto, Fernández Camacho, Asunción, Lucas, S.
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2014
País:España
Institución:Universidad de Sevilla (US)
Repositorio:idUS. Depósito de Investigación de la Universidad de Sevilla
OAI Identifier:oai:idus.us.es:11441/81125
Acceso en línea:https://hdl.handle.net/11441/81125
https://doi.org/10.1088/0957-4484/25/35/355705
Access Level:acceso abierto
Palabra clave:Porous silicon
Oblique angle deposition
Growth model
Monte Carlo simulation
Magnetron sputtering
Porosity formation
Nanostructure
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spelling On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique anglesFortio Godinho, Vanda CristinaMoskovkin, P.Álvarez Molina, RafaelCaballero Hernández, JaimeSchierholz, R.Bera, B.Demarche, J.Palmero Acebedo, AlbertoFernández Camacho, AsunciónLucas, S.Porous siliconOblique angle depositionGrowth modelMonte Carlo simulationMagnetron sputteringPorosity formationNanostructureThe formation of the porous structure in dc magnetron sputtered amorphous silicon thin films at low temperatures is studied when using helium and/or argon as the processing gas. In each case, a-Si thin films were simultaneously grown at two different locations in the reactor which led to the assembly of different porous structures. The set of four fabricated samples has been analyzed at the microstructural level to elucidate the characteristics of the porous structure under the different deposition conditions. With the help of a growth model, we conclude that the chemical nature of the sputter gas not only affects the sputtering mechanism of Si atoms from the target and their subsequent transport in the gaseous/plasma phase towards the film, but also the pore formation mechanism and dynamics. When Ar is used, pores emerge as a direct result of the shadowing processes of Si atoms, in agreement with Thornton's structure zone model. The introduction of He produces, in addition to the shadowing effects, a new process where a degree of mobility results in the coarsening of small pores. Our results also highlight the influence of the composition of sputtering gas and tilt angles (for oblique angle deposition) on the formation of open and/or occluded porosityEuropean Union CT-REGPOT-2011-1-285895Consejo Superior de Investigaciones Científicas PIE 201060E102, PIE 201460E018Ministerio de Economía y Competitividad CSD2008–00023, CTQ2012-32519, MAT2013-40852-RJunta de Andalucía TEP217 PE2012, TEP862, PE2010-FQM-6900Institute of Physics Publishing2014info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionapplication/pdfapplication/pdfhttps://hdl.handle.net/11441/81125https://doi.org/10.1088/0957-4484/25/35/355705reponame:idUS. Depósito de Investigación de la Universidad de Sevillainstname:Universidad de Sevilla (US)InglésNanotechnology, 25, 355705-.CT-REGPOT-2011-1-285895PIE 201060E102PIE 201460E018CSD2008–00023CTQ2012-32519MAT2013-40852-RTEP217 PE2012TEP862PE2010-FQM-6900http://dx.doi.org/10.1088/0957-4484/25/35/355705info:eu-repo/semantics/openAccessoai:idus.us.es:11441/811252026-06-17T12:51:07Z
dc.title.none.fl_str_mv On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles
title On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles
spellingShingle On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles
Fortio Godinho, Vanda Cristina
Porous silicon
Oblique angle deposition
Growth model
Monte Carlo simulation
Magnetron sputtering
Porosity formation
Nanostructure
title_short On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles
title_full On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles
title_fullStr On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles
title_full_unstemmed On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles
title_sort On the formation of the porous structure in nanostructured a-Si coatings deposited by dc magnetron sputtering at oblique angles
dc.creator.none.fl_str_mv Fortio Godinho, Vanda Cristina
Moskovkin, P.
Álvarez Molina, Rafael
Caballero Hernández, Jaime
Schierholz, R.
Bera, B.
Demarche, J.
Palmero Acebedo, Alberto
Fernández Camacho, Asunción
Lucas, S.
author Fortio Godinho, Vanda Cristina
author_facet Fortio Godinho, Vanda Cristina
Moskovkin, P.
Álvarez Molina, Rafael
Caballero Hernández, Jaime
Schierholz, R.
Bera, B.
Demarche, J.
Palmero Acebedo, Alberto
Fernández Camacho, Asunción
Lucas, S.
author_role author
author2 Moskovkin, P.
Álvarez Molina, Rafael
Caballero Hernández, Jaime
Schierholz, R.
Bera, B.
Demarche, J.
Palmero Acebedo, Alberto
Fernández Camacho, Asunción
Lucas, S.
author2_role author
author
author
author
author
author
author
author
author
dc.subject.none.fl_str_mv Porous silicon
Oblique angle deposition
Growth model
Monte Carlo simulation
Magnetron sputtering
Porosity formation
Nanostructure
topic Porous silicon
Oblique angle deposition
Growth model
Monte Carlo simulation
Magnetron sputtering
Porosity formation
Nanostructure
description The formation of the porous structure in dc magnetron sputtered amorphous silicon thin films at low temperatures is studied when using helium and/or argon as the processing gas. In each case, a-Si thin films were simultaneously grown at two different locations in the reactor which led to the assembly of different porous structures. The set of four fabricated samples has been analyzed at the microstructural level to elucidate the characteristics of the porous structure under the different deposition conditions. With the help of a growth model, we conclude that the chemical nature of the sputter gas not only affects the sputtering mechanism of Si atoms from the target and their subsequent transport in the gaseous/plasma phase towards the film, but also the pore formation mechanism and dynamics. When Ar is used, pores emerge as a direct result of the shadowing processes of Si atoms, in agreement with Thornton's structure zone model. The introduction of He produces, in addition to the shadowing effects, a new process where a degree of mobility results in the coarsening of small pores. Our results also highlight the influence of the composition of sputtering gas and tilt angles (for oblique angle deposition) on the formation of open and/or occluded porosity
publishDate 2014
dc.date.none.fl_str_mv 2014
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/11441/81125
https://doi.org/10.1088/0957-4484/25/35/355705
url https://hdl.handle.net/11441/81125
https://doi.org/10.1088/0957-4484/25/35/355705
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Nanotechnology, 25, 355705-.
CT-REGPOT-2011-1-285895
PIE 201060E102
PIE 201460E018
CSD2008–00023
CTQ2012-32519
MAT2013-40852-R
TEP217 PE2012
TEP862
PE2010-FQM-6900
http://dx.doi.org/10.1088/0957-4484/25/35/355705
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
application/pdf
dc.publisher.none.fl_str_mv Institute of Physics Publishing
publisher.none.fl_str_mv Institute of Physics Publishing
dc.source.none.fl_str_mv reponame:idUS. Depósito de Investigación de la Universidad de Sevilla
instname:Universidad de Sevilla (US)
instname_str Universidad de Sevilla (US)
reponame_str idUS. Depósito de Investigación de la Universidad de Sevilla
collection idUS. Depósito de Investigación de la Universidad de Sevilla
repository.name.fl_str_mv
repository.mail.fl_str_mv
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