Supporting Information for Spin Hall magnetoresistance effect from a disordered interface

ADMR and FDMR of the control sample consisting of TaOx/Cu/Ti/MnPSe3; ADMR measured in the transversal configuration in the α plane, at T = 50, 90, and 150 K; FDMR measured in the transversal configuration in the α plane at T = 50 K and T = 90 K; TEM cross-section and EDX profile of a measured device...

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Detalles Bibliográficos
Autores: Catalano, Sara, Gomez-Perez, Juan M., Xochitl Aguilar-Pujol, M., Chuvilin, Andrey, Gobbi, Marco, Hueso, Luis E., Casanova, Félix
Tipo de recurso: conjunto de datos
Fecha de publicación:2022
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/310411
Acceso en línea:http://hdl.handle.net/10261/310411
Access Level:acceso abierto
Palabra clave:Spintronics
Interfaces
2D materials
Spin hall magnetoresistance
Descripción
Sumario:ADMR and FDMR of the control sample consisting of TaOx/Cu/Ti/MnPSe3; ADMR measured in the transversal configuration in the α plane, at T = 50, 90, and 150 K; FDMR measured in the transversal configuration in the α plane at T = 50 K and T = 90 K; TEM cross-section and EDX profile of a measured device; and discussion of the HMR mechanism (PDF).