Observation of a Mott insulating ground state for Sn/Ge(111) at low temperature
We report an investigation on the properties of 0.33 ML of Sn on Ge(111) at temperatures down to 5 K. Low-energy electron diffraction and scanning tunneling microscopy show that the (3 x 3) phase formed at similar to 200 K, reverts to a new (root 3 x root 3)R30 degrees phase below 30 K. The vertical...
| Autores: | , , , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2006 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/51309 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/51309 |
| Access Level: | acceso abierto |
| Palabra clave: | 538.9 Dynamical fluctuations Surface phase Transition Photoemission Semiconductors Diamond Física de materiales |
| Sumario: | We report an investigation on the properties of 0.33 ML of Sn on Ge(111) at temperatures down to 5 K. Low-energy electron diffraction and scanning tunneling microscopy show that the (3 x 3) phase formed at similar to 200 K, reverts to a new (root 3 x root 3)R30 degrees phase below 30 K. The vertical distortion characteristic of the (3 x 3) phase is lost across the phase transition, which is fully reversible. Angle-resolved photoemission experiments show that, concomitantly with the structural phase transition, a metal-insulator phase transition takes place. The (root 3 x root 3)R30 degrees ground state is interpreted as the formation of a Mott insulator for a narrow half-filled band in a two-dimensional triangular lattice. |
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