Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuum
Chemicals and CAS Registry Numbers cobalt 7440-48-4 helium 7440-59-7 silicon 7440-21-3 zirconium 14940-68-2, 7440-67-7
| Autores: | , , , , , , , , |
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| Formato: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2025 |
| País: | España |
| Recursos: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/398642 |
| Acesso em linha: | http://hdl.handle.net/10261/398642 https://api.elsevier.com/content/abstract/scopus_id/105009542761 |
| Access Level: | acceso abierto |
| Palavra-chave: | Si and Zr 4He and 3He charged thin films Helium assisted magnetron sputtering of Co Helium release by thermal annealing IBA analysis Microstructural characterization Nanobubbles and nanopores |
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oai:digital.csic.es:10261/398642 |
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Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuumFernández-Camacho, A.de Haro, M Carmen JiménezHufschmidt, DirkMontes, OlgaSauvage, ThierryFerrer, F JavierCaillard, AmaëlBrault, PascalThomann, Anne-LiseSi and Zr4He and 3He charged thin filmsHelium assisted magnetron sputtering of CoHelium release by thermal annealingIBA analysisMicrostructural characterizationNanobubbles and nanoporesChemicals and CAS Registry Numbers cobalt 7440-48-4 helium 7440-59-7 silicon 7440-21-3 zirconium 14940-68-2, 7440-67-7Sputtering of cobalt, silicon and zirconium in a helium magnetron discharge (MS) is reported as a bottom-up procedure to obtain He-charged films (i.e. 4He and 3He filled nanopores encapsulated in the matrix material). Composition and microstructural analyses are presented from ion beam analysis (IBA) and scanning and transmission electron microscopies (SEM and TEM). Helium desorption was investigated by IBA in a dedicated chamber for "in situ" thermal evolution in vacuum. The simultaneous recording of the helium and matrix-element signals shows different behaviors of the different matrix elements (i.e. Co, Si and Zr) and deposition conditions (i.e., DC or RF discharge modes and dynamic or quasistatic vacuum). Effusion, blistering, delamination and flaking have been observed for the different samples leading to the formation of nano-porous/nanostructured thin films. The methodology is being envisaged as a process for nanostructured thin-films fabrication with potential applications.We acknowledge the assistance of I. Rosa for the cross-section TEM lamellas preparation and Olivier Wendling for technical support during IBA analyses.Peer reviewedNature Publishing GroupFernández, Asunción [0000-0002-7487-7054]Jiménez- de Haro, M. Carmen [0000-0003-1850-8091]Hufschmidt, Dirk [0000-0001-8189-4656]Montes, Olga [0000-0001-7778-5713]Sauvage, Thierry [0000-0001-8100-2187]Ferrer, F. Javier [0000-0003-1840-2553]Caillard, Amaël [0000-0001-9540-1381]Brault, Pascal [0000-0002-8380-480X]Thomann, Anne-Lise [0000-0002-8524-9694]Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202520252025info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Publisher's versioninfo:eu-repo/semantics/publishedVersionapplication/pdfhttp://hdl.handle.net/10261/398642https://api.elsevier.com/content/abstract/scopus_id/105009542761reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Ingléshttps://doi.org/10.1038/s41598-025-06889-8Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/3986422026-05-22T06:33:51Z |
| dc.title.none.fl_str_mv |
Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuum |
| title |
Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuum |
| spellingShingle |
Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuum Fernández-Camacho, A. Si and Zr 4He and 3He charged thin films Helium assisted magnetron sputtering of Co Helium release by thermal annealing IBA analysis Microstructural characterization Nanobubbles and nanopores |
| title_short |
Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuum |
| title_full |
Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuum |
| title_fullStr |
Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuum |
| title_full_unstemmed |
Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuum |
| title_sort |
Microstructure and composition evolution of He charged solid-gas nanocomposite films of different matrix elements during thermal annealing in vacuum |
| dc.creator.none.fl_str_mv |
Fernández-Camacho, A. de Haro, M Carmen Jiménez Hufschmidt, Dirk Montes, Olga Sauvage, Thierry Ferrer, F Javier Caillard, Amaël Brault, Pascal Thomann, Anne-Lise |
| author |
Fernández-Camacho, A. |
| author_facet |
Fernández-Camacho, A. de Haro, M Carmen Jiménez Hufschmidt, Dirk Montes, Olga Sauvage, Thierry Ferrer, F Javier Caillard, Amaël Brault, Pascal Thomann, Anne-Lise |
| author_role |
author |
| author2 |
de Haro, M Carmen Jiménez Hufschmidt, Dirk Montes, Olga Sauvage, Thierry Ferrer, F Javier Caillard, Amaël Brault, Pascal Thomann, Anne-Lise |
| author2_role |
author author author author author author author author |
| dc.contributor.none.fl_str_mv |
Fernández, Asunción [0000-0002-7487-7054] Jiménez- de Haro, M. Carmen [0000-0003-1850-8091] Hufschmidt, Dirk [0000-0001-8189-4656] Montes, Olga [0000-0001-7778-5713] Sauvage, Thierry [0000-0001-8100-2187] Ferrer, F. Javier [0000-0003-1840-2553] Caillard, Amaël [0000-0001-9540-1381] Brault, Pascal [0000-0002-8380-480X] Thomann, Anne-Lise [0000-0002-8524-9694] Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72] |
| dc.subject.none.fl_str_mv |
Si and Zr 4He and 3He charged thin films Helium assisted magnetron sputtering of Co Helium release by thermal annealing IBA analysis Microstructural characterization Nanobubbles and nanopores |
| topic |
Si and Zr 4He and 3He charged thin films Helium assisted magnetron sputtering of Co Helium release by thermal annealing IBA analysis Microstructural characterization Nanobubbles and nanopores |
| description |
Chemicals and CAS Registry Numbers cobalt 7440-48-4 helium 7440-59-7 silicon 7440-21-3 zirconium 14940-68-2, 7440-67-7 |
| publishDate |
2025 |
| dc.date.none.fl_str_mv |
2025 2025 2025 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article http://purl.org/coar/resource_type/c_6501 Publisher's version info:eu-repo/semantics/publishedVersion |
| format |
article |
| status_str |
publishedVersion |
| dc.identifier.none.fl_str_mv |
http://hdl.handle.net/10261/398642 https://api.elsevier.com/content/abstract/scopus_id/105009542761 |
| url |
http://hdl.handle.net/10261/398642 https://api.elsevier.com/content/abstract/scopus_id/105009542761 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.relation.none.fl_str_mv |
https://doi.org/10.1038/s41598-025-06889-8 Sí |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess |
| eu_rights_str_mv |
openAccess |
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application/pdf |
| dc.publisher.none.fl_str_mv |
Nature Publishing Group |
| publisher.none.fl_str_mv |
Nature Publishing Group |
| dc.source.none.fl_str_mv |
reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC instname:Consejo Superior de Investigaciones Científicas (CSIC) |
| instname_str |
Consejo Superior de Investigaciones Científicas (CSIC) |
| reponame_str |
DIGITAL.CSIC. Repositorio Institucional del CSIC |
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DIGITAL.CSIC. Repositorio Institucional del CSIC |
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1869413055544164352 |
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15.812429 |