Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.

[EN] Lead-free (Bi0.5Na0.5)1-xBaxTiO3 (BNBT) thin films with compositions at x = 0.055, 0.100, and 0.150 were prepared by chemical solution deposition on Pt/TiO2/SiO2/(100)Si substrates. The dielectric behavior of the films was studied, and the ferroelectricantiferroelectric phase transition observe...

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Autores: Bretos, Íñigo, Alonso-San-José, David, Jiménez, Ricardo, Ricote, J., Calzada, M. L.
Tipo de recurso: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2011
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/345768
Acceso en línea:http://hdl.handle.net/10261/345768
Access Level:acceso abierto
Palabra clave:Dielectrics
Ferroelectrics
Perovskites
Thin films
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spelling Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.Bretos, ÍñigoAlonso-San-José, DavidJiménez, RicardoRicote, J.Calzada, M. L.DielectricsFerroelectricsPerovskitesThin films[EN] Lead-free (Bi0.5Na0.5)1-xBaxTiO3 (BNBT) thin films with compositions at x = 0.055, 0.100, and 0.150 were prepared by chemical solution deposition on Pt/TiO2/SiO2/(100)Si substrates. The dielectric behavior of the films was studied, and the ferroelectricantiferroelectric phase transition observed was used to situate the morphotropic phase boundary (MPB) for compositions with x ~0.100 (BNBT-10), a value that differs from that reported for bulk materials (BNBT-5.5). Extrinsic effects derived from the thin-film configuration (e.g., microstrains, residual stresses) may be responsible for the shift of the MPB. Consequently, the dielectric permittivity is significantly improved for this composition, showing the best ferroelectric response obtained up to now for films of the BNBT system (Pr = 13.0 µC/cm2, Ec = 70 kV/cm).This work was financed by Spanish Projects MAT2007-61409 and MAT2010-15365. I.B. acknowledges the support of the JAE-Doc (CSIC) program.Elsevier BVMinisterio de Educación y Ciencia (España)Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]2024202420112024info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Postprintinfo:eu-repo/semantics/acceptedVersionhttp://hdl.handle.net/10261/345768reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglés#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#info:eu-repo/grantAgreement/MEC//MAT2007-61409info:eu-repo/grantAgreement/MICINN//MAT2010-15365https://doi.org/10.1016/j.matlet.2011.05.111Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/3457682026-05-22T06:33:51Z
dc.title.none.fl_str_mv Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.
title Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.
spellingShingle Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.
Bretos, Íñigo
Dielectrics
Ferroelectrics
Perovskites
Thin films
title_short Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.
title_full Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.
title_fullStr Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.
title_full_unstemmed Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.
title_sort Evidence of morphotropic phase boundary displacement in lead-free (Bi(0.5)Na(0.5))(1-x)Ba(x)TiO(3) polycrystalline thin films.
dc.creator.none.fl_str_mv Bretos, Íñigo
Alonso-San-José, David
Jiménez, Ricardo
Ricote, J.
Calzada, M. L.
author Bretos, Íñigo
author_facet Bretos, Íñigo
Alonso-San-José, David
Jiménez, Ricardo
Ricote, J.
Calzada, M. L.
author_role author
author2 Alonso-San-José, David
Jiménez, Ricardo
Ricote, J.
Calzada, M. L.
author2_role author
author
author
author
dc.contributor.none.fl_str_mv Ministerio de Educación y Ciencia (España)
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Dielectrics
Ferroelectrics
Perovskites
Thin films
topic Dielectrics
Ferroelectrics
Perovskites
Thin films
description [EN] Lead-free (Bi0.5Na0.5)1-xBaxTiO3 (BNBT) thin films with compositions at x = 0.055, 0.100, and 0.150 were prepared by chemical solution deposition on Pt/TiO2/SiO2/(100)Si substrates. The dielectric behavior of the films was studied, and the ferroelectricantiferroelectric phase transition observed was used to situate the morphotropic phase boundary (MPB) for compositions with x ~0.100 (BNBT-10), a value that differs from that reported for bulk materials (BNBT-5.5). Extrinsic effects derived from the thin-film configuration (e.g., microstrains, residual stresses) may be responsible for the shift of the MPB. Consequently, the dielectric permittivity is significantly improved for this composition, showing the best ferroelectric response obtained up to now for films of the BNBT system (Pr = 13.0 µC/cm2, Ec = 70 kV/cm).
publishDate 2011
dc.date.none.fl_str_mv 2011
2024
2024
2024
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Postprint
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/345768
url http://hdl.handle.net/10261/345768
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv #PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
info:eu-repo/grantAgreement/MEC//MAT2007-61409
info:eu-repo/grantAgreement/MICINN//MAT2010-15365
https://doi.org/10.1016/j.matlet.2011.05.111

dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
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dc.publisher.none.fl_str_mv Elsevier BV
publisher.none.fl_str_mv Elsevier BV
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