Evolution of the crystalline structure in (Bi0.5Na0.5)1-xBa x TiO3 thin films around the Morphotropic Phase Boundary
(Bi0.5Na0.5)1-xBax TiO3 (BNBT), which exhibits compositions for the morphotropic phase boundary (MPB) where exist an intimate coexistence of the rhombohedral and tetragonal structures, is being considered as promising lead-free alternative to the well known Pb(Zrx,Ti1-x)O3 (PZT). In this work, BNBT...
| Autores: | , , , , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2014 |
| País: | España |
| Institución: | Universidad de Sevilla (US) |
| Repositorio: | idUS. Depósito de Investigación de la Universidad de Sevilla |
| OAI Identifier: | oai:idus.us.es:11441/147305 |
| Acceso en línea: | https://hdl.handle.net/11441/147305 https://doi.org/10.3989/cyv.32014 |
| Access Level: | acceso abierto |
| Palabra clave: | Thin films lead-free ferroelectrics morphotropic phase boundary Láminas delgadas ferroeléctricos sin plomo frontera de fase morfotrópica |
| Sumario: | (Bi0.5Na0.5)1-xBax TiO3 (BNBT), which exhibits compositions for the morphotropic phase boundary (MPB) where exist an intimate coexistence of the rhombohedral and tetragonal structures, is being considered as promising lead-free alternative to the well known Pb(Zrx,Ti1-x)O3 (PZT). In this work, BNBT thin films were fabricated by chemical solution deposition (CSD) with a wide range of compositions (x~0.050-0.150) onto Pt/TiO2 /SiO2 /(100)Si substrates. Structural studies by X-ray diffraction (λCu~1.5406 Å) using a four-circle goniometer were carried out to determine the crystalline structure of the films. Rietveld analysis of the experimental X-ray patterns showed different volume fractions of the rhombohedral and tetragonal phases as a function of the Ba2+ content and the coexistence of both phases, characteristic of a MPB region, for x∼0.055-0.080. Finally, Rutherford backscattering experiments (RBS) were performed to determine the compositional profile of the films. This study revealed a homogenous composition of the BNBT films with abrupt film/substrate interfaces. |
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