Supplementary Information Effect of crystallinity and thickness on thermal transport in layered PtSe2
15 pages. -- Supplementary Figure 1. Reflection high energy electron diffraction (RHEED) measurements and the final structure of the PtSe2 wedge sample. -- Supplementary Figure 2. X-ray diffraction measurements in PtSe2. -- Supplementary Figure 3. AFM measurements. -- Supplementary Note 1: FDTR sens...
| Autores: | , , , , , , , , , , , , , |
|---|---|
| Tipo de recurso: | conjunto de datos |
| Fecha de publicación: | 2022 |
| País: | España |
| Institución: | Consejo Superior de Investigaciones Científicas (CSIC) |
| Repositorio: | DIGITAL.CSIC. Repositorio Institucional del CSIC |
| OAI Identifier: | oai:digital.csic.es:10261/329981 |
| Acceso en línea: | http://hdl.handle.net/10261/329981 |
| Access Level: | acceso abierto |
| Palabra clave: | 2D materials PtSe2 Thermal conductivity Phonon lifetimes Frequency domain thermoreflectance |
| Sumario: | 15 pages. -- Supplementary Figure 1. Reflection high energy electron diffraction (RHEED) measurements and the final structure of the PtSe2 wedge sample. -- Supplementary Figure 2. X-ray diffraction measurements in PtSe2. -- Supplementary Figure 3. AFM measurements. -- Supplementary Note 1: FDTR sensitivity analysis. -- Supplementary Figure 4. Phase sensitivity analysis for thin PtSe2 films. -- Supplementary Figure 5. Phase sensitivity analysis for bulk PtSe2. -- Supplementary Note 2: Spot size measurements. -- Supplementary Figure 6. Spot size measurements. -- Supplementary Note 3: Three omega measurements. -- Supplementary Figure 7. Three omega measurements. -- Supplementary Note 4: Raman thermometry measurements. -- Supplementary Table 1. Measured cross-plane thermal conductivity obtained by Raman thermometry and FDTR. -- Supplementary Figure 8. Raman thermometry measurements. -- Supplementary Note 5: Fourier transform from ASOPS data. -- Supplementary Figure 9. Fast Fourier transform of the layered breathing modes. -- Supplementary Figure 10. DFT calculations. -- Supplementary Figure 11. FDTR data from bulk PtSe2 crystal and the best model fit in a low frequency range (20 kHz - 1 MHz) for a ratio kr/kz = 9. -- Supplementary Figure 12. (a) XRD radial scans in the polycrystalline wedge sample showing the polycrystalline nature of the PtSe2 film. -- Supplementary Figure 13. Interface thermal resistance measurements. -- Supplementary Figure 14. Raman line scan between 1 and 3 ML PtSe2 in the crystalline wedge sample. |
|---|