Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement

The fabrication of substrates for Surface Enhanced Raman Scattering (SERS) applications matching the needs for high sensitive and reproducible sensors remains a major scientific and technological issue. We correlate the morphological parameters of silver (Ag) nanostructured thin films prepared by sp...

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Authors: Santoro, Gonzalo, Yu, S., Schwartzkopf, M., Zhang, P., Koyiloth Vayalil, S., Risch, J.F.H., Rübhausen, M.A., Hernández, Margarita, Domingo, Concepción, Roth, S.V.
Format: article
Publication Date:2014
Country:España
Institution:Consejo Superior de Investigaciones Científicas (CSIC)
Repository:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/110705
Online Access:http://hdl.handle.net/10261/110705
Access Level:Open access
Keyword:Raman scattering
Surface enhanced
Silver
Nanofabrication
Thin film growth
Sputter deposition
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spelling Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancementSantoro, GonzaloYu, S.Schwartzkopf, M.Zhang, P.Koyiloth Vayalil, S.Risch, J.F.H.Rübhausen, M.A.Hernández, MargaritaDomingo, ConcepciónRoth, S.V.Raman scatteringSurface enhancedSilverNanofabricationThin film growthSputter depositionThe fabrication of substrates for Surface Enhanced Raman Scattering (SERS) applications matching the needs for high sensitive and reproducible sensors remains a major scientific and technological issue. We correlate the morphological parameters of silver (Ag) nanostructured thin films prepared by sputter deposition on flat silicon (Si) substrates with their SERS activity. A maximum enhancement of the SERS signal has been found at the Ag percolation threshold, leading to the detection of thiophenol, a non-resonant Raman probe, at concentrations as low as 10-10M, which corresponds to enhancement factors higher than 7 orders of magnitude. To gain full control over the developed nanostructure, we employed the combination of in-situ time-resolved microfocus Grazing Incidence Small Angle X-ray Scattering with sputter deposition. This enables to achieve a deepened understanding of the different growth regimes of Ag. Thereby an improved tailoring of the thin film nanostructure for SERS applications can be realized. © 2014 AIP Publishing LLC.Peer ReviewedAmerican Institute of Physics2015201520142015info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501http://hdl.handle.net/10261/110705reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglésinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/1107052026-05-22T06:33:51Z
dc.title.none.fl_str_mv Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement
title Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement
spellingShingle Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement
Santoro, Gonzalo
Raman scattering
Surface enhanced
Silver
Nanofabrication
Thin film growth
Sputter deposition
title_short Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement
title_full Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement
title_fullStr Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement
title_full_unstemmed Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement
title_sort Silver substrates for surface enhanced Raman scattering: Correlation between nanostructure and Raman scattering enhancement
dc.creator.none.fl_str_mv Santoro, Gonzalo
Yu, S.
Schwartzkopf, M.
Zhang, P.
Koyiloth Vayalil, S.
Risch, J.F.H.
Rübhausen, M.A.
Hernández, Margarita
Domingo, Concepción
Roth, S.V.
author Santoro, Gonzalo
author_facet Santoro, Gonzalo
Yu, S.
Schwartzkopf, M.
Zhang, P.
Koyiloth Vayalil, S.
Risch, J.F.H.
Rübhausen, M.A.
Hernández, Margarita
Domingo, Concepción
Roth, S.V.
author_role author
author2 Yu, S.
Schwartzkopf, M.
Zhang, P.
Koyiloth Vayalil, S.
Risch, J.F.H.
Rübhausen, M.A.
Hernández, Margarita
Domingo, Concepción
Roth, S.V.
author2_role author
author
author
author
author
author
author
author
author
dc.subject.none.fl_str_mv Raman scattering
Surface enhanced
Silver
Nanofabrication
Thin film growth
Sputter deposition
topic Raman scattering
Surface enhanced
Silver
Nanofabrication
Thin film growth
Sputter deposition
description The fabrication of substrates for Surface Enhanced Raman Scattering (SERS) applications matching the needs for high sensitive and reproducible sensors remains a major scientific and technological issue. We correlate the morphological parameters of silver (Ag) nanostructured thin films prepared by sputter deposition on flat silicon (Si) substrates with their SERS activity. A maximum enhancement of the SERS signal has been found at the Ag percolation threshold, leading to the detection of thiophenol, a non-resonant Raman probe, at concentrations as low as 10-10M, which corresponds to enhancement factors higher than 7 orders of magnitude. To gain full control over the developed nanostructure, we employed the combination of in-situ time-resolved microfocus Grazing Incidence Small Angle X-ray Scattering with sputter deposition. This enables to achieve a deepened understanding of the different growth regimes of Ag. Thereby an improved tailoring of the thin film nanostructure for SERS applications can be realized. © 2014 AIP Publishing LLC.
publishDate 2014
dc.date.none.fl_str_mv 2014
2015
2015
2015
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/110705
url http://hdl.handle.net/10261/110705
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv American Institute of Physics
publisher.none.fl_str_mv American Institute of Physics
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869411694698037248
score 15,811543

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