Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance

This paper reports on the phase transformation occurring in evaporated thin films of the organic semiconductor 2-decyl-7-phenyl[1]benzothieno[3,2-b][1]benzothiophene (Ph-BTBT-10), along with its impact on the performance of organic thin-film field-effect transistors (OFETs). Temperature-dependent X-...

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Autores: Fijahi, Lamiaa, Yan, Shunya, James, Ann Maria, Zhang, Min, Cazorla, Alba, Tamayo, Adrián, Li, Jinghai, Ocal, Carmen, Barrena, Esther, Resel, Roland, Mas Torrent, Marta
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2025
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:dnet:digitalcsic_::39f77ad5b0dcaac55a1a9523c90074a8
Acceso en línea:http://hdl.handle.net/10261/431461
https://api.elsevier.com/content/abstract/scopus_id/105015622788
Access Level:acceso abierto
Palabra clave:Kelvin probe force microscopy
OFET
organic semiconductor
Ph-BTBT-10
polymorphism
X-ray reflectivity
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spelling Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device PerformanceFijahi, LamiaaYan, ShunyaJames, Ann MariaZhang, MinCazorla, AlbaTamayo, AdriánLi, JinghaiOcal, CarmenBarrena, EstherResel, RolandMas Torrent, MartaKelvin probe force microscopyOFETorganic semiconductorPh-BTBT-10polymorphismX-ray reflectivityThis paper reports on the phase transformation occurring in evaporated thin films of the organic semiconductor 2-decyl-7-phenyl[1]benzothieno[3,2-b][1]benzothiophene (Ph-BTBT-10), along with its impact on the performance of organic thin-film field-effect transistors (OFETs). Temperature-dependent X-ray reflectivity (XRR) studies reveal that the films crystallize in a single-layer structure, which converts to a bilayer phase in the temperature range of 110°C –140°C; at further elevated temperatures, a liquid-crystal phase is formed. The conversion of the as-evaporated films to the bilayer structure is investigated by atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) at specific annealing temperatures. The combination of XRR, AFM, and KPFM points out that only at the higher annealing temperature the phase transformation is completed. In a subsequent stage, the films are investigated as active layers in OFETs. An enhanced performance is observed in the annealed films with a higher mobility and reduced level of charge traps. The best electrical characteristics are realized when the bilayer transformation is fully accomplished.This work was funded by European Union's Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No 811284 (UHMob) and by MCIN/AEI/10.13039/501100011033/ERDF, UE with projects SENSATION PID2022-141393OB-I00, RED2022-134503-T, and PDC2022-133750-I00, and through the “Severo Ochoa” Programme for Centers of Excellence in R&D (CEX2023-001263-S). The authors also thank Generalitat de Catalunya (2021-SGR-00443). This study is part of the Advanced Materials programme (In-CAEM project) and is partially supported by MCIN with funding from European Union NextGenerationEU (PRTR-C17.I1). M.Z. and S.Y. are financially supported by the China Scholarship Council (CSC) under Grant No. 202006990034. This work has been carried out within the framework of the doctoral PhD program of Material Science of the Universitat Autònoma de Barcelona (UAB).With funding from the Spanish government through the ‘Severo Ochoa Centre of Excellence’ accreditation (CEX2023-001263-S).Peer reviewedWiley-VCHEuropean CommissionMinisterio de Ciencia e Innovación (España)Agencia Estatal de Investigación (España)Generalitat de CatalunyaChina Scholarship CouncilMas Torrent, Marta [0000-0002-1586-005X]Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202620262025info:eu-repo/semantics/articlePublisher's versioninfo:eu-repo/semantics/publishedVersionhttp://hdl.handle.net/10261/431461https://api.elsevier.com/content/abstract/scopus_id/105015622788reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglés#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#info:eu-repo/grantAgreement/EC/H2020/811284info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2022-141393OB-I00info:eu-repo/grantAgreement/MICINN/Plan Estatal de investigación Científica y Técnica y de Innovación 2021-2023/RED2022-134503-Tinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PDC2022-133750-I00info:eu-repo/grantAgreement/AEI/Plan Estatal de investigación Científica y Técnica y de Innovación 2021-2023/CEX2023-001263-SAdvanced Materials Interfaceshttp://doi.org/10.1002/admi.202500599Síinfo:eu-repo/semantics/openAccessoai:dnet:digitalcsic_::39f77ad5b0dcaac55a1a9523c90074a82026-05-22T06:33:51Z
dc.title.none.fl_str_mv Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance
title Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance
spellingShingle Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance
Fijahi, Lamiaa
Kelvin probe force microscopy
OFET
organic semiconductor
Ph-BTBT-10
polymorphism
X-ray reflectivity
title_short Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance
title_full Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance
title_fullStr Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance
title_full_unstemmed Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance
title_sort Phase Transformations in Evaporated Ph-BTBT-10 Thin Films and Impact on the Device Performance
dc.creator.none.fl_str_mv Fijahi, Lamiaa
Yan, Shunya
James, Ann Maria
Zhang, Min
Cazorla, Alba
Tamayo, Adrián
Li, Jinghai
Ocal, Carmen
Barrena, Esther
Resel, Roland
Mas Torrent, Marta
author Fijahi, Lamiaa
author_facet Fijahi, Lamiaa
Yan, Shunya
James, Ann Maria
Zhang, Min
Cazorla, Alba
Tamayo, Adrián
Li, Jinghai
Ocal, Carmen
Barrena, Esther
Resel, Roland
Mas Torrent, Marta
author_role author
author2 Yan, Shunya
James, Ann Maria
Zhang, Min
Cazorla, Alba
Tamayo, Adrián
Li, Jinghai
Ocal, Carmen
Barrena, Esther
Resel, Roland
Mas Torrent, Marta
author2_role author
author
author
author
author
author
author
author
author
author
dc.contributor.none.fl_str_mv European Commission
Ministerio de Ciencia e Innovación (España)
Agencia Estatal de Investigación (España)
Generalitat de Catalunya
China Scholarship Council
Mas Torrent, Marta [0000-0002-1586-005X]
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Kelvin probe force microscopy
OFET
organic semiconductor
Ph-BTBT-10
polymorphism
X-ray reflectivity
topic Kelvin probe force microscopy
OFET
organic semiconductor
Ph-BTBT-10
polymorphism
X-ray reflectivity
description This paper reports on the phase transformation occurring in evaporated thin films of the organic semiconductor 2-decyl-7-phenyl[1]benzothieno[3,2-b][1]benzothiophene (Ph-BTBT-10), along with its impact on the performance of organic thin-film field-effect transistors (OFETs). Temperature-dependent X-ray reflectivity (XRR) studies reveal that the films crystallize in a single-layer structure, which converts to a bilayer phase in the temperature range of 110°C –140°C; at further elevated temperatures, a liquid-crystal phase is formed. The conversion of the as-evaporated films to the bilayer structure is investigated by atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) at specific annealing temperatures. The combination of XRR, AFM, and KPFM points out that only at the higher annealing temperature the phase transformation is completed. In a subsequent stage, the films are investigated as active layers in OFETs. An enhanced performance is observed in the annealed films with a higher mobility and reduced level of charge traps. The best electrical characteristics are realized when the bilayer transformation is fully accomplished.
publishDate 2025
dc.date.none.fl_str_mv 2025
2026
2026
dc.type.none.fl_str_mv info:eu-repo/semantics/article
Publisher's version
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/431461
https://api.elsevier.com/content/abstract/scopus_id/105015622788
url http://hdl.handle.net/10261/431461
https://api.elsevier.com/content/abstract/scopus_id/105015622788
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv #PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
info:eu-repo/grantAgreement/EC/H2020/811284
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2022-141393OB-I00
info:eu-repo/grantAgreement/MICINN/Plan Estatal de investigación Científica y Técnica y de Innovación 2021-2023/RED2022-134503-T
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PDC2022-133750-I00
info:eu-repo/grantAgreement/AEI/Plan Estatal de investigación Científica y Técnica y de Innovación 2021-2023/CEX2023-001263-S
Advanced Materials Interfaces
http://doi.org/10.1002/admi.202500599
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv Wiley-VCH
publisher.none.fl_str_mv Wiley-VCH
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
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