Experimental Demonstration of a Magnetically Induced Warping Transition in a Topological Insulator Mediated by Rare-Earth Surface Dopants [Dataset]

20 pages. -- I. Growth methods. -- II. Er deposition and X-ray photoemission spectroscopy (XPS) coverage calibration. -- III. Er/Bi2Se2Te extended ARPES and XPS data. -- IV. Dy/Bi2Se2Te extended ARPES and XPS data. -- V. Theoretical model. -- VI. Theoretical prove of the Fermi velocity anisotropy up...

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Detalhes bibliográficos
Autores: Muñiz, Beatriz, Ferreiros, Yago, Pantaleón, Pierre A., Dai, Ji, Tallarida, Massimo, Figueroa, Adriana I., Marinova, Vera, García-Díez, Kevin, Mugarza, Aitor, Valenzuela, Sergio O., Miranda, Rodolfo, Camarero, Julio, Guinea, Francisco, Silva-Guillén, José Ángel, Valbuena, Miguel A.
Formato: conjunto de datos
Fecha de publicación:2023
País:España
Recursos:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/341307
Acesso em linha:http://hdl.handle.net/10261/341307
Access Level:acceso abierto
Palavra-chave:Topological insulator mediated
Resolved photoemission spectroscopy
Range ferromagnetic order
Fermi level toward
Eventually breaking time
Subsequent bandgap opening
Magnetically induced bandgap
Dopant coverage results
Control magnetic interactions
Tss warped shape
2
Magnetic zeeman
Gap opening
Experimental results
Viable routes
Type doping
Tunable p
Tss rationalizes
Thereby allowing
Theoretical model
Reversal symmetry
Plane term
Novel class
Magnetically rare
Hamiltonian governing
Gradual tuning
Experimental demonstration
Also observed
Descrição
Resumo:20 pages. -- I. Growth methods. -- II. Er deposition and X-ray photoemission spectroscopy (XPS) coverage calibration. -- III. Er/Bi2Se2Te extended ARPES and XPS data. -- IV. Dy/Bi2Se2Te extended ARPES and XPS data. -- V. Theoretical model. -- VI. Theoretical prove of the Fermi velocity anisotropy upon Er doping. -- VII. MDCs and EDCs fittings: band dispersion and gap opening. -- VIII. Structural characterization: LEED patters.

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