Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes

One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of one-shot devices do not get destroyed when tested, and so can continue within the experiment, providing extra information...

Descripción completa

Detalles Bibliográficos
Autores: Balakrishnan, Narayanaswamy, Castilla González, Elena María, Jaenada Malagón, María, Pardo Llorente, Leandro
Tipo de recurso: artículo
Fecha de publicación:2022
País:España
Institución:Universidad Complutense de Madrid (UCM)
Repositorio:Docta Complutense
Idioma:inglés
OAI Identifier:oai:docta.ucm.es:20.500.14352/71929
Acceso en línea:https://hdl.handle.net/20.500.14352/71929
Access Level:acceso abierto
Palabra clave:519.8
Methodology
Statistics Theory
Matemáticas (Matemáticas)
Investigación operativa (Matemáticas)
12 Matemáticas
1207 Investigación Operativa
id ES_71dee5999afdbd08ead0cbb3de6ddded
oai_identifier_str oai:docta.ucm.es:20.500.14352/71929
network_acronym_str ES
network_name_str España
repository_id_str
spelling Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimesBalakrishnan, NarayanaswamyCastilla González, Elena MaríaJaenada Malagón, MaríaPardo Llorente, Leandro519.8MethodologyStatistics TheoryMatemáticas (Matemáticas)Investigación operativa (Matemáticas)12 Matemáticas1207 Investigación OperativaOne-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of one-shot devices do not get destroyed when tested, and so can continue within the experiment, providing extra information for inference, if they did not fail before an inspection time. In addition, their reliability can be rapidly estimated via accelerated life tests (ALTs) by running the tests at varying and higher stress levels than working conditions. In particular, step-stress tests allow the experimenter to increase the stress levels at pre-fixed times gradually during the life-testing experiment. The cumulative exposure model is commonly assumed for step-stress models, relating the lifetime distribution of units at one stress level to the lifetime distributions at preceding stress levels. In this paper, we develop robust estimators and Z-type test statistics based on the density power divergence (DPD) for testing linear null hypothesis for non-destructive one-shot devices under the step-stress ALTs with exponential lifetime distribution. We study asymptotic and robustness properties of the estimators and test statistics, yielding point estimation and conffidence intervals for different lifetime characteristic such as reliability, distribution quantiles and mean lifetime of the devices. A simulation study is carried out to assess the performance of the methods of inference developed here and some real-life data sets are analyzed ffinally for illustrative purpose.Universidad Complutense de Madrid20222022-01-0120222022-01-01journal articlehttp://purl.org/coar/resource_type/c_6501info:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/20.500.14352/71929reponame:Docta Complutenseinstname:Universidad Complutense de Madrid (UCM)Inglésengopen accesshttp://purl.org/coar/access_right/c_abf2Atribución 3.0 Españahttps://creativecommons.org/licenses/by/3.0/es/info:eu-repo/semantics/openAccessoai:docta.ucm.es:20.500.14352/719292026-06-02T12:44:21Z
dc.title.none.fl_str_mv Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
title Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
spellingShingle Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
Balakrishnan, Narayanaswamy
519.8
Methodology
Statistics Theory
Matemáticas (Matemáticas)
Investigación operativa (Matemáticas)
12 Matemáticas
1207 Investigación Operativa
title_short Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
title_full Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
title_fullStr Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
title_full_unstemmed Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
title_sort Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
dc.creator.none.fl_str_mv Balakrishnan, Narayanaswamy
Castilla González, Elena María
Jaenada Malagón, María
Pardo Llorente, Leandro
author Balakrishnan, Narayanaswamy
author_facet Balakrishnan, Narayanaswamy
Castilla González, Elena María
Jaenada Malagón, María
Pardo Llorente, Leandro
author_role author
author2 Castilla González, Elena María
Jaenada Malagón, María
Pardo Llorente, Leandro
author2_role author
author
author
dc.contributor.none.fl_str_mv Universidad Complutense de Madrid
dc.subject.none.fl_str_mv 519.8
Methodology
Statistics Theory
Matemáticas (Matemáticas)
Investigación operativa (Matemáticas)
12 Matemáticas
1207 Investigación Operativa
topic 519.8
Methodology
Statistics Theory
Matemáticas (Matemáticas)
Investigación operativa (Matemáticas)
12 Matemáticas
1207 Investigación Operativa
description One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of one-shot devices do not get destroyed when tested, and so can continue within the experiment, providing extra information for inference, if they did not fail before an inspection time. In addition, their reliability can be rapidly estimated via accelerated life tests (ALTs) by running the tests at varying and higher stress levels than working conditions. In particular, step-stress tests allow the experimenter to increase the stress levels at pre-fixed times gradually during the life-testing experiment. The cumulative exposure model is commonly assumed for step-stress models, relating the lifetime distribution of units at one stress level to the lifetime distributions at preceding stress levels. In this paper, we develop robust estimators and Z-type test statistics based on the density power divergence (DPD) for testing linear null hypothesis for non-destructive one-shot devices under the step-stress ALTs with exponential lifetime distribution. We study asymptotic and robustness properties of the estimators and test statistics, yielding point estimation and conffidence intervals for different lifetime characteristic such as reliability, distribution quantiles and mean lifetime of the devices. A simulation study is carried out to assess the performance of the methods of inference developed here and some real-life data sets are analyzed ffinally for illustrative purpose.
publishDate 2022
dc.date.none.fl_str_mv 2022
2022-01-01
2022
2022-01-01
dc.type.none.fl_str_mv journal article
http://purl.org/coar/resource_type/c_6501
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://hdl.handle.net/20.500.14352/71929
url https://hdl.handle.net/20.500.14352/71929
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
Atribución 3.0 España
https://creativecommons.org/licenses/by/3.0/es/
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
Atribución 3.0 España
https://creativecommons.org/licenses/by/3.0/es/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.source.none.fl_str_mv reponame:Docta Complutense
instname:Universidad Complutense de Madrid (UCM)
instname_str Universidad Complutense de Madrid (UCM)
reponame_str Docta Complutense
collection Docta Complutense
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869410683459731456
score 15,300724

Similares en LA Referencia