Balakrishnan, N., Castilla González, E. M., Jaenada Malagón, M., & Pardo Llorente, L. (2022). Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes.
Citación estilo ChicagoBalakrishnan, Narayanaswamy, Elena María Castilla González, María Jaenada Malagón, y Leandro Pardo Llorente. Robust Inference for Non-destructive One-shot Device Testing Under Step-stress Model With Exponential Lifetimes. 2022.
Cita MLABalakrishnan, Narayanaswamy, Elena María Castilla González, María Jaenada Malagón, y Leandro Pardo Llorente. Robust Inference for Non-destructive One-shot Device Testing Under Step-stress Model With Exponential Lifetimes. 2022.
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