RRAM random number generator based on train of pulses

In this paper, the modulation of the conductance levels of resistive random access memory (RRAM) devices is used for the generation of random numbers by applying a train of RESET pulses. The influence of the pulse amplitude and width on the device resistance is also analyzed. For each pulse characte...

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Detalles Bibliográficos
Autores: Yang, Binbin, Arumi Delgado, Daniel|||0000-0002-6638-7485, Manich Bou, Salvador|||0000-0001-5265-1209, Gómez Pau, Álvaro|||0000-0002-7774-1662, Rodríguez Montañés, Rosa|||0000-0001-6231-0862, Bargalló González, Mireia, Campabadal, Francesca, Fang, Liang
Tipo de recurso: artículo
Fecha de publicación:2021
País:España
Institución:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/355114
Acceso en línea:https://hdl.handle.net/2117/355114
https://dx.doi.org/10.3390/electronics10151831
Access Level:acceso abierto
Palabra clave:Computer security
Computer storage devices
RRAM
Random number generator
Hardware security
TRNG
NVM
Seguretat informàtica
Ordinadors -- Dispositius de memòria
Memòria d'accés aleatori
Àrees temàtiques de la UPC::Enginyeria electrònica
Àrees temàtiques de la UPC::Informàtica::Seguretat informàtica
Descripción
Sumario:In this paper, the modulation of the conductance levels of resistive random access memory (RRAM) devices is used for the generation of random numbers by applying a train of RESET pulses. The influence of the pulse amplitude and width on the device resistance is also analyzed. For each pulse characteristic, the number of pulses required to drive the device to a particular resistance threshold is variable, and it is exploited to extract random numbers. Based on this behavior, a random number generator (RNG) circuit is proposed. To assess the performance of the circuit, the National Institute of Standards and Technology (NIST) randomness tests are applied to evaluate the randomness of the bitstreams obtained. The experimental results show that four random bits are simultaneously obtained, passing all the applied tests without the need for post-processing. The presented method provides a new strategy to generate random numbers based on RRAMs for hardware security applications.