Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films

Thermoelectric (TE) materials are promising for energy-generating devices, and their design depends on a fast, precise determination of their Seebeck coefficient and electrical conductivity. Herein, a low-cost setup was developed to determine the Seebeck coefficient and electrical conductivity of th...

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Autores: Dalkiranis, Gustavo G., Bocchi, João H. C., Torres, Bruno Bassi Millan, Lopeandía, Aitor, Oliveira Jr., Osvaldo N., Faria, Gregório C.
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2025
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/389617
Acceso en línea:http://hdl.handle.net/10261/389617
https://api.elsevier.com/content/abstract/scopus_id/105002494259
Access Level:acceso abierto
Palabra clave:Electrical conductivity
Instrumentation
Measurement system
Power factor (PF)
Seebeck coefficient
Thermoelectricity
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spelling Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin FilmsDalkiranis, Gustavo G.Bocchi, João H. C.Torres, Bruno Bassi MillanLopeandía, AitorOliveira Jr., Osvaldo N.Faria, Gregório C.Electrical conductivityInstrumentationMeasurement systemPower factor (PF)Seebeck coefficientThermoelectricityThermoelectric (TE) materials are promising for energy-generating devices, and their design depends on a fast, precise determination of their Seebeck coefficient and electrical conductivity. Herein, a low-cost setup was developed to determine the Seebeck coefficient and electrical conductivity of thin films, allowing the calculation of the power factor (PF) (PF = S2σ) . The system was validated by measuring the Seebeck coefficient and electrical conductivity of poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS), a widely used material in organic electronics and TE generators. The results demonstrate the high resolution of our system, with obtained values of 0.1 µV/K for Seebeck coefficient, 0.1 S/cm for electrical conductivity, and 0.1 µW/K2 for PF. A detailed description of the fabrication of the measurement setup is provided, with the aim of making thermoelectricity accessible to any research laboratory, even in places with limited budgets.This work was supported in part by the National Institute of Science and Technology for Organic Electronics (INCT/INEO), in part by the National Council for Scientific and Technological Development (CNPq, Brazil) under Grant 141507/2023-3, in part by São Paulo Research Foundation (FAPESP, Brazil) under Grant 2018/22214-6 and Grant 2019/26375-7, and in part by the Coordination of Superior Level Staff Improvement (CAPES, Brazil).Peer reviewedInstitute of Electrical and Electronics EngineersInstituto Nacional de Eletrônica Orgânica (Brasil)Instituto Nacional de Ciência e Tecnologia (Brasil)Conselho Nacional de Desenvolvimento Científico e Tecnológico (Brasil)Fundação de Amparo à Pesquisa do Estado de São PauloCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (Brasil)Dalkiranis, Gustavo G. [0000-0001-9590-9249]Bocchi, João H. C. [0000-0001-5178-0746]Torres, Bruno Bassi Millan [0000-0001-5999-6488]Lopeandía, Aitor [0000-0003-0566-8299]Oliveira Jr., Osvaldo N. [0000-0002-5399-5860]Faria, Gregório C. [0000-0001-6138-8473]Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202520252025info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Publisher's versioninfo:eu-repo/semantics/publishedVersionapplication/pdfhttp://hdl.handle.net/10261/389617https://api.elsevier.com/content/abstract/scopus_id/105002494259reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)InglésThe underlying dataset has been published as supplementary material of the article in the publisher platform at DOI 10.1109/TIM.2025.3553254https://doi.org/10.1109/TIM.2025.3553254Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/3896172026-05-22T06:33:51Z
dc.title.none.fl_str_mv Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films
title Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films
spellingShingle Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films
Dalkiranis, Gustavo G.
Electrical conductivity
Instrumentation
Measurement system
Power factor (PF)
Seebeck coefficient
Thermoelectricity
title_short Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films
title_full Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films
title_fullStr Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films
title_full_unstemmed Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films
title_sort Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films
dc.creator.none.fl_str_mv Dalkiranis, Gustavo G.
Bocchi, João H. C.
Torres, Bruno Bassi Millan
Lopeandía, Aitor
Oliveira Jr., Osvaldo N.
Faria, Gregório C.
author Dalkiranis, Gustavo G.
author_facet Dalkiranis, Gustavo G.
Bocchi, João H. C.
Torres, Bruno Bassi Millan
Lopeandía, Aitor
Oliveira Jr., Osvaldo N.
Faria, Gregório C.
author_role author
author2 Bocchi, João H. C.
Torres, Bruno Bassi Millan
Lopeandía, Aitor
Oliveira Jr., Osvaldo N.
Faria, Gregório C.
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Instituto Nacional de Eletrônica Orgânica (Brasil)
Instituto Nacional de Ciência e Tecnologia (Brasil)
Conselho Nacional de Desenvolvimento Científico e Tecnológico (Brasil)
Fundação de Amparo à Pesquisa do Estado de São Paulo
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (Brasil)
Dalkiranis, Gustavo G. [0000-0001-9590-9249]
Bocchi, João H. C. [0000-0001-5178-0746]
Torres, Bruno Bassi Millan [0000-0001-5999-6488]
Lopeandía, Aitor [0000-0003-0566-8299]
Oliveira Jr., Osvaldo N. [0000-0002-5399-5860]
Faria, Gregório C. [0000-0001-6138-8473]
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Electrical conductivity
Instrumentation
Measurement system
Power factor (PF)
Seebeck coefficient
Thermoelectricity
topic Electrical conductivity
Instrumentation
Measurement system
Power factor (PF)
Seebeck coefficient
Thermoelectricity
description Thermoelectric (TE) materials are promising for energy-generating devices, and their design depends on a fast, precise determination of their Seebeck coefficient and electrical conductivity. Herein, a low-cost setup was developed to determine the Seebeck coefficient and electrical conductivity of thin films, allowing the calculation of the power factor (PF) (PF = S2σ) . The system was validated by measuring the Seebeck coefficient and electrical conductivity of poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS), a widely used material in organic electronics and TE generators. The results demonstrate the high resolution of our system, with obtained values of 0.1 µV/K for Seebeck coefficient, 0.1 S/cm for electrical conductivity, and 0.1 µW/K2 for PF. A detailed description of the fabrication of the measurement setup is provided, with the aim of making thermoelectricity accessible to any research laboratory, even in places with limited budgets.
publishDate 2025
dc.date.none.fl_str_mv 2025
2025
2025
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Publisher's version
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/389617
https://api.elsevier.com/content/abstract/scopus_id/105002494259
url http://hdl.handle.net/10261/389617
https://api.elsevier.com/content/abstract/scopus_id/105002494259
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv The underlying dataset has been published as supplementary material of the article in the publisher platform at DOI 10.1109/TIM.2025.3553254
https://doi.org/10.1109/TIM.2025.3553254
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers
publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15.811543

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