Cita APA

Dalkiranis, G. G., Bocchi, J. H. C., Torres, B. B. M., Lopeandía, A., Oliveira Jr., O. N., & Faria, G. C. (2025). Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films.

Citación estilo Chicago

Dalkiranis, Gustavo G., João H. C. Bocchi, Bruno Bassi Millan Torres, Aitor Lopeandía, Osvaldo N. Oliveira Jr., y Gregório C. Faria. Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films. 2025.

Cita MLA

Dalkiranis, Gustavo G., et al. Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films. 2025.