Analysis of the extra delay on interconnects caused by resistive opens and shorts. Draft
As a difference from previous approaches, the approach described in this report starts from the set of partial differential equations governing the dynamics of a pair of coupled RC interconnects, thus capturing the distributed nature of such lines. As it is shown below, the inclusion of a punctual d...
| Autores: | , |
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| Tipo de recurso: | informe técnico |
| Fecha de publicación: | 2009 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/441949 |
| Acceso en línea: | https://hdl.handle.net/2117/441949 |
| Access Level: | acceso abierto |
| Palabra clave: | Partial differential equations RC interconnects Defect Delay Àrees temàtiques de la UPC::Enginyeria electrònica Àrees temàtiques de la UPC::Enginyeria electrònica::Aspectes socials |
| Sumario: | As a difference from previous approaches, the approach described in this report starts from the set of partial differential equations governing the dynamics of a pair of coupled RC interconnects, thus capturing the distributed nature of such lines. As it is shown below, the inclusion of a punctual defect (open or short) in any point of the line introduces a new boundary condition to the coupled set of PDEs. By means of a change of variables, this set is decoupled and an analytical solution is found. This solution is further simplified to obtain expressions for the extra delay due to the open/short, which may be useful for the design/test engineers. To validate these results, the report presents a comparison between the analytical solutions and electrical simulation of a pair of coupled interconnects. |
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