Ellipsometric characterization of random and random-dimer GaAs-Alx-Ga_(1-x)As superlattices

We studied the optical properties of ordered and intentionally disordered GaAs-AlxGa1-xAs superlattices, with and without dimer-type correlations in the disorder, by means of spectroscopic ellipsometry. The electronic structure of the superlattices has been calculated and compared with the experimen...

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Detalles Bibliográficos
Autores: Bellani, V., Parravicini, G. B., Díez Alcántara, Eduardo, Domínguez-Adame Acosta, Francisco, Hey, R.
Tipo de recurso: artículo
Fecha de publicación:2002
País:España
Institución:Universidad Complutense de Madrid (UCM)
Repositorio:Docta Complutense
Idioma:inglés
OAI Identifier:oai:docta.ucm.es:20.500.14352/59349
Acceso en línea:https://hdl.handle.net/20.500.14352/59349
Access Level:acceso abierto
Palabra clave:538.9
Interband-Transitions
Localization
Absence
Física de materiales
Descripción
Sumario:We studied the optical properties of ordered and intentionally disordered GaAs-AlxGa1-xAs superlattices, with and without dimer-type correlations in the disorder, by means of spectroscopic ellipsometry. The electronic structure of the superlattices has been calculated and compared with the experiments. The optical transitions in ordered, correlated, and uncorrelated disordered superlattices show specific features that we relate to their different electronic structures.