A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures

From an optical perspective, depending on the relationship between the real (n) and imaginary (k) parts of its refractive index, three broad categories of materials can be distinguished: metals (k ¿ n), dielectrics (n ¿ k), and materials in which n ¿ k (termed here excitonic materials). The modes an...

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Autores: Imas González, José Javier, Matías Maestro, Ignacio, Del Villar, Ignacio, Ozcariz Celaya, Aritz, Vitoria Pascual, Ignacio, Ruiz Zamarreño, Carlos
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2025
País:España
Institución:Universidad Pública de Navarra
Repositorio:Academica-e. Repositorio Institucional de la Universidad Pública de Navarra
OAI Identifier:oai:academica-e.unavarra.es:2454/52537
Acceso en línea:https://hdl.handle.net/2454/52537
Access Level:acceso abierto
Palabra clave:Double interface structure
Long range surface exciton polariton (LRSEP)
Long range surface plasmon polariton (LRSPP)
Lossy mode resonance (LMR)
Optical resonances
Surface plasmon resonance (SPR)
Thin film
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spelling A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structuresImas González, José JavierMatías Maestro, IgnacioDel Villar, IgnacioOzcariz Celaya, AritzVitoria Pascual, IgnacioRuiz Zamarreño, CarlosDouble interface structureLong range surface exciton polariton (LRSEP)Long range surface plasmon polariton (LRSPP)Lossy mode resonance (LMR)Optical resonancesSurface plasmon resonance (SPR)Thin filmFrom an optical perspective, depending on the relationship between the real (n) and imaginary (k) parts of its refractive index, three broad categories of materials can be distinguished: metals (k ¿ n), dielectrics (n ¿ k), and materials in which n ¿ k (termed here excitonic materials). The modes and optical resonances that appear in a thin film bounded by two dielectrics with similar refractive index, what we call here a double interface structure, have been widely studied in the case of metals, but not for dielectrics, or materials with n ¿ k. In this work, we propose a new approach, based on employing the phase matching condition to correlate the resonances that appear in the wavelength versus incident angle color maps of the reflected power with the modal analysis of the cross section of the structure. This analysis is performed, using an attenuated total reflection (ATR) setup, for thin film materials that belong to each of the mentioned categories: a metal (gold, Au), a dielectric (titanium dioxide, TiO2), and a material with n ¿ k (chromium, Cr). The theoretical analysis is supported with experimental results. It is demonstrated that this method enables to identify any resonance at any wavelength or incident angle, being valid for all three types of materials. Therefore, it is considered the suggested approach will help the research in these materials and in the double interface structure in the optics and photonics field.This work was supported by Agencia Estatal de Investigación (PID2022-137437OB-I00).ElsevierIngeniería Eléctrica, Electrónica y de ComunicaciónIngeniaritza Elektrikoa, Elektronikoa eta Telekomunikazio IngeniaritzaInstitute of Smart Cities - ISC2025info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionapplication/pdfapplication/mswordhttps://hdl.handle.net/2454/52537reponame:Academica-e. Repositorio Institucional de la Universidad Pública de Navarrainstname:Universidad Pública de NavarraInglésinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2022-137437OB-I00© 2024 The Author(s). This is an open access article under the CC BY-NC-ND license.https://creativecommons.org/licenses/by-nc-nd/4.0/info:eu-repo/semantics/openAccessoai:academica-e.unavarra.es:2454/525372026-06-17T12:41:47Z
dc.title.none.fl_str_mv A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures
title A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures
spellingShingle A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures
Imas González, José Javier
Double interface structure
Long range surface exciton polariton (LRSEP)
Long range surface plasmon polariton (LRSPP)
Lossy mode resonance (LMR)
Optical resonances
Surface plasmon resonance (SPR)
Thin film
title_short A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures
title_full A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures
title_fullStr A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures
title_full_unstemmed A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures
title_sort A comprehensive study of optical resonances in metals, dielectrics, and excitonic materials in double interface structures
dc.creator.none.fl_str_mv Imas González, José Javier
Matías Maestro, Ignacio
Del Villar, Ignacio
Ozcariz Celaya, Aritz
Vitoria Pascual, Ignacio
Ruiz Zamarreño, Carlos
author Imas González, José Javier
author_facet Imas González, José Javier
Matías Maestro, Ignacio
Del Villar, Ignacio
Ozcariz Celaya, Aritz
Vitoria Pascual, Ignacio
Ruiz Zamarreño, Carlos
author_role author
author2 Matías Maestro, Ignacio
Del Villar, Ignacio
Ozcariz Celaya, Aritz
Vitoria Pascual, Ignacio
Ruiz Zamarreño, Carlos
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Ingeniería Eléctrica, Electrónica y de Comunicación
Ingeniaritza Elektrikoa, Elektronikoa eta Telekomunikazio Ingeniaritza
Institute of Smart Cities - ISC
dc.subject.none.fl_str_mv Double interface structure
Long range surface exciton polariton (LRSEP)
Long range surface plasmon polariton (LRSPP)
Lossy mode resonance (LMR)
Optical resonances
Surface plasmon resonance (SPR)
Thin film
topic Double interface structure
Long range surface exciton polariton (LRSEP)
Long range surface plasmon polariton (LRSPP)
Lossy mode resonance (LMR)
Optical resonances
Surface plasmon resonance (SPR)
Thin film
description From an optical perspective, depending on the relationship between the real (n) and imaginary (k) parts of its refractive index, three broad categories of materials can be distinguished: metals (k ¿ n), dielectrics (n ¿ k), and materials in which n ¿ k (termed here excitonic materials). The modes and optical resonances that appear in a thin film bounded by two dielectrics with similar refractive index, what we call here a double interface structure, have been widely studied in the case of metals, but not for dielectrics, or materials with n ¿ k. In this work, we propose a new approach, based on employing the phase matching condition to correlate the resonances that appear in the wavelength versus incident angle color maps of the reflected power with the modal analysis of the cross section of the structure. This analysis is performed, using an attenuated total reflection (ATR) setup, for thin film materials that belong to each of the mentioned categories: a metal (gold, Au), a dielectric (titanium dioxide, TiO2), and a material with n ¿ k (chromium, Cr). The theoretical analysis is supported with experimental results. It is demonstrated that this method enables to identify any resonance at any wavelength or incident angle, being valid for all three types of materials. Therefore, it is considered the suggested approach will help the research in these materials and in the double interface structure in the optics and photonics field.
publishDate 2025
dc.date.none.fl_str_mv 2025
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2454/52537
url https://hdl.handle.net/2454/52537
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2021-2023/PID2022-137437OB-I00
dc.rights.none.fl_str_mv © 2024 The Author(s). This is an open access article under the CC BY-NC-ND license.
https://creativecommons.org/licenses/by-nc-nd/4.0/
info:eu-repo/semantics/openAccess
rights_invalid_str_mv © 2024 The Author(s). This is an open access article under the CC BY-NC-ND license.
https://creativecommons.org/licenses/by-nc-nd/4.0/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
application/msword
dc.publisher.none.fl_str_mv Elsevier
publisher.none.fl_str_mv Elsevier
dc.source.none.fl_str_mv reponame:Academica-e. Repositorio Institucional de la Universidad Pública de Navarra
instname:Universidad Pública de Navarra
instname_str Universidad Pública de Navarra
reponame_str Academica-e. Repositorio Institucional de la Universidad Pública de Navarra
collection Academica-e. Repositorio Institucional de la Universidad Pública de Navarra
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,812429

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