Reliability: fallacy or reality?
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability...
| Autores: | , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2007 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/102015 |
| Acceso en línea: | https://hdl.handle.net/2117/102015 https://dx.doi.org/10.1109/MM.2007.107 |
| Access Level: | acceso abierto |
| Palabra clave: | Integrated circuits -- Reliability Circuits integrats -- Fiabilitat Àrees temàtiques de la UPC::Informàtica::Arquitectura de computadors |
| Sumario: | As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it. |
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