Synchrotron computer tomography as a characterization method for engineering materials
X-ray tomography is a non-destructive imag-ing technique enabling a three-dimensional representation of the irradiated volume, its internal architecture and subsequently a qualitative and quantitative evaluation of materials. It is thus an attractive method for examinations in the field of materials...
| Autores: | , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2018 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/387381 |
| Acceso en línea: | https://hdl.handle.net/2117/387381 https://dx.doi.org/10.3139/147.110534 |
| Access Level: | acceso abierto |
| Palabra clave: | Synchrotrons Sincrotrons Àrees temàtiques de la UPC::Enginyeria dels materials |
| Sumario: | X-ray tomography is a non-destructive imag-ing technique enabling a three-dimensional representation of the irradiated volume, its internal architecture and subsequently a qualitative and quantitative evaluation of materials. It is thus an attractive method for examinations in the field of materials science, where the correlation between macroscopic properties and microstructure often is of major interest. In particular, to-mography using high-energy synchrotron radiation is well suited for the examination of metallic materials due to its high penetration. |
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