End‐to‐end image analysis pipeline for liquid‐phase electron microscopy

Liquid phase transmission electron microscopy allows the imaging of materials in liquid environments. The sample is encapsulated within electron-beam transparent windows and hence protected by the ultrahigh vacuum necessary within the electron gun. Such an approach allows to study biological and sof...

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Detalles Bibliográficos
Autores: Marchello, G., De Pace, C., Duro‐Castano, A., Battaglia, G., Ruiz‐Perez, Lorena
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2020
País:España
Institución:Universidad de Barcelona
Repositorio:Dipòsit Digital de la UB
OAI Identifier:oai:diposit.ub.edu:2445/216517
Acceso en línea:https://hdl.handle.net/2445/216517
Access Level:acceso abierto
Palabra clave:Microscòpia electrònica de transmissió
Microscòpia electrònica
Transmission electron microscopy
Electron microscopy
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spelling End‐to‐end image analysis pipeline for liquid‐phase electron microscopyMarchello, G.De Pace, C.Duro‐Castano, A.Battaglia, G.Ruiz‐Perez, LorenaMicroscòpia electrònica de transmissióMicroscòpia electrònicaTransmission electron microscopyElectron microscopyLiquid phase transmission electron microscopy allows the imaging of materials in liquid environments. The sample is encapsulated within electron-beam transparent windows and hence protected by the ultrahigh vacuum necessary within the electron gun. Such an approach allows to study biological and soft materials in their natural environment and offers the possibility of accessing their dynamic nature. Yet, the electron beam scattering from the windows and solvent increases the image noise and blur. Herein, we propose a pipeline to both de-noise and sharpen images obtained by liquid transmission electron microscopy. We develop the workflow in a way that it does not require any human interference, nor introduce artefacts, but actually unveils features of the imaged samples covered by the noise and the blur.Wiley2020info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionapplication/pdfhttps://hdl.handle.net/2445/216517Articles publicats en revistes (Física Aplicada)reponame:Dipòsit Digital de la UBinstname:Universidad de BarcelonaInglésReproducció del document publicat a: https://doi.org/10.1111/jmi.12889Journal of Microscopy-Oxford, 2020, vol. 279, num.3, p. 242-248https://doi.org/10.1111/jmi.12889cc-by (c) Marchello, G., et al., 2020http://creativecommons.org/licenses/by/3.0/es/info:eu-repo/semantics/openAccessoai:diposit.ub.edu:2445/2165172026-05-27T06:46:51Z
dc.title.none.fl_str_mv End‐to‐end image analysis pipeline for liquid‐phase electron microscopy
title End‐to‐end image analysis pipeline for liquid‐phase electron microscopy
spellingShingle End‐to‐end image analysis pipeline for liquid‐phase electron microscopy
Marchello, G.
Microscòpia electrònica de transmissió
Microscòpia electrònica
Transmission electron microscopy
Electron microscopy
title_short End‐to‐end image analysis pipeline for liquid‐phase electron microscopy
title_full End‐to‐end image analysis pipeline for liquid‐phase electron microscopy
title_fullStr End‐to‐end image analysis pipeline for liquid‐phase electron microscopy
title_full_unstemmed End‐to‐end image analysis pipeline for liquid‐phase electron microscopy
title_sort End‐to‐end image analysis pipeline for liquid‐phase electron microscopy
dc.creator.none.fl_str_mv Marchello, G.
De Pace, C.
Duro‐Castano, A.
Battaglia, G.
Ruiz‐Perez, Lorena
author Marchello, G.
author_facet Marchello, G.
De Pace, C.
Duro‐Castano, A.
Battaglia, G.
Ruiz‐Perez, Lorena
author_role author
author2 De Pace, C.
Duro‐Castano, A.
Battaglia, G.
Ruiz‐Perez, Lorena
author2_role author
author
author
author
dc.subject.none.fl_str_mv Microscòpia electrònica de transmissió
Microscòpia electrònica
Transmission electron microscopy
Electron microscopy
topic Microscòpia electrònica de transmissió
Microscòpia electrònica
Transmission electron microscopy
Electron microscopy
description Liquid phase transmission electron microscopy allows the imaging of materials in liquid environments. The sample is encapsulated within electron-beam transparent windows and hence protected by the ultrahigh vacuum necessary within the electron gun. Such an approach allows to study biological and soft materials in their natural environment and offers the possibility of accessing their dynamic nature. Yet, the electron beam scattering from the windows and solvent increases the image noise and blur. Herein, we propose a pipeline to both de-noise and sharpen images obtained by liquid transmission electron microscopy. We develop the workflow in a way that it does not require any human interference, nor introduce artefacts, but actually unveils features of the imaged samples covered by the noise and the blur.
publishDate 2020
dc.date.none.fl_str_mv 2020
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2445/216517
url https://hdl.handle.net/2445/216517
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Reproducció del document publicat a: https://doi.org/10.1111/jmi.12889
Journal of Microscopy-Oxford, 2020, vol. 279, num.3, p. 242-248
https://doi.org/10.1111/jmi.12889
dc.rights.none.fl_str_mv cc-by (c) Marchello, G., et al., 2020
http://creativecommons.org/licenses/by/3.0/es/
info:eu-repo/semantics/openAccess
rights_invalid_str_mv cc-by (c) Marchello, G., et al., 2020
http://creativecommons.org/licenses/by/3.0/es/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Wiley
publisher.none.fl_str_mv Wiley
dc.source.none.fl_str_mv Articles publicats en revistes (Física Aplicada)
reponame:Dipòsit Digital de la UB
instname:Universidad de Barcelona
instname_str Universidad de Barcelona
reponame_str Dipòsit Digital de la UB
collection Dipòsit Digital de la UB
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,812429

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