End‐to‐end image analysis pipeline for liquid‐phase electron microscopy

Liquid phase transmission electron microscopy allows the imaging of materials in liquid environments. The sample is encapsulated within electron-beam transparent windows and hence protected by the ultrahigh vacuum necessary within the electron gun. Such an approach allows to study biological and sof...

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Detalles Bibliográficos
Autores: Marchello, G., De Pace, C., Duro‐Castano, A., Battaglia, G., Ruiz‐Perez, Lorena
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2020
País:España
Institución:Universidad de Barcelona
Repositorio:Dipòsit Digital de la UB
OAI Identifier:oai:diposit.ub.edu:2445/216517
Acceso en línea:https://hdl.handle.net/2445/216517
Access Level:acceso abierto
Palabra clave:Microscòpia electrònica de transmissió
Microscòpia electrònica
Transmission electron microscopy
Electron microscopy
Descripción
Sumario:Liquid phase transmission electron microscopy allows the imaging of materials in liquid environments. The sample is encapsulated within electron-beam transparent windows and hence protected by the ultrahigh vacuum necessary within the electron gun. Such an approach allows to study biological and soft materials in their natural environment and offers the possibility of accessing their dynamic nature. Yet, the electron beam scattering from the windows and solvent increases the image noise and blur. Herein, we propose a pipeline to both de-noise and sharpen images obtained by liquid transmission electron microscopy. We develop the workflow in a way that it does not require any human interference, nor introduce artefacts, but actually unveils features of the imaged samples covered by the noise and the blur.