Probing Conductivity of Polyelectrolyte/Nanoparticle Composite Films by Scanning Electrochemical Microscopy
An advanced electroanalytical technique, scanning electrochemical microscopy (SECM), is used as a new approach to measure both the lateral (in-plane) and cross-film electron transport in multilayer polymer/nanoparticle films. The sensitivity of SECM is such that the conductivity of a single nanopart...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión aceptada para publicación |
| Fecha de publicación: | 2003 |
| País: | España |
| Institución: | Universidad de Burgos (UBU) |
| Repositorio: | Repositorio Institucional de la Universidad de Burgos (RIUBU) |
| OAI Identifier: | oai:riubu.ubu.es:10259/11087 |
| Acceso en línea: | https://hdl.handle.net/10259/11087 |
| Access Level: | acceso abierto |
| Palabra clave: | Electrical conductivity Layers Nanoparticles Redox reactions Thin films Nanotecnología Microscopía Electroquímica Nanotechnology Microscopy Electrochemistry |
| Sumario: | An advanced electroanalytical technique, scanning electrochemical microscopy (SECM), is used as a new approach to measure both the lateral (in-plane) and cross-film electron transport in multilayer polymer/nanoparticle films. The sensitivity of SECM is such that the conductivity of a single nanoparticle monolayer can be quantified. The increase in SECM tip current with the number of polyelectrolyte/nanoparticle layer pairs demonstrates that the subsequent layers are not electrically insulated from each other and that there is significant communication between nanoparticles in different layers. |
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