Probing Conductivity of Polyelectrolyte/Nanoparticle Composite Films by Scanning Electrochemical Microscopy

An advanced electroanalytical technique, scanning electrochemical microscopy (SECM), is used as a new approach to measure both the lateral (in-plane) and cross-film electron transport in multilayer polymer/nanoparticle films. The sensitivity of SECM is such that the conductivity of a single nanopart...

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Detalles Bibliográficos
Autores: Ruiz Fernández, Virginia, Liljeroth, Peter, Quinn, Bernadette M., Kontturi, Kyösti
Tipo de recurso: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2003
País:España
Institución:Universidad de Burgos (UBU)
Repositorio:Repositorio Institucional de la Universidad de Burgos (RIUBU)
OAI Identifier:oai:riubu.ubu.es:10259/11087
Acceso en línea:https://hdl.handle.net/10259/11087
Access Level:acceso abierto
Palabra clave:Electrical conductivity
Layers
Nanoparticles
Redox reactions
Thin films
Nanotecnología
Microscopía
Electroquímica
Nanotechnology
Microscopy
Electrochemistry
Descripción
Sumario:An advanced electroanalytical technique, scanning electrochemical microscopy (SECM), is used as a new approach to measure both the lateral (in-plane) and cross-film electron transport in multilayer polymer/nanoparticle films. The sensitivity of SECM is such that the conductivity of a single nanoparticle monolayer can be quantified. The increase in SECM tip current with the number of polyelectrolyte/nanoparticle layer pairs demonstrates that the subsequent layers are not electrically insulated from each other and that there is significant communication between nanoparticles in different layers.